Method and apparatus for interactive generation of device response templates and analysis
First Claim
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1. A method for generating a device response template at a testing device relative to a device under test (DUT) communicatively linked thereto, comprising:
- sending a command to the DUT from the testing device;
receiving the command response at the testing device from the DUT, the command response including a plurality of parameters;
patternizing the command response, including,defining a parameter pattern within the plurality of parameters in the command response;
assigning a type to the pattern;
creating, in an electronic memory of the testing device, a device response template including a location of the pattern within the plurality of parameters, to identify the pattern in subsequent device testing.
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Abstract
A device response template generator software program includes an interactive graphical-user-interface (GUI) for sending commands to devices under test and to capture and display the command responses. The GUI allows patternization of the command response to that the information contained in the response can be read, in the form of variable values, automatically, during subsequent execution of the commands by the same device or a group of devices. These values of the variables may be analyzed and may also be sent to other running testing scenarios.
26 Citations
15 Claims
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1. A method for generating a device response template at a testing device relative to a device under test (DUT) communicatively linked thereto, comprising:
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sending a command to the DUT from the testing device; receiving the command response at the testing device from the DUT, the command response including a plurality of parameters; patternizing the command response, including, defining a parameter pattern within the plurality of parameters in the command response; assigning a type to the pattern; creating, in an electronic memory of the testing device, a device response template including a location of the pattern within the plurality of parameters, to identify the pattern in subsequent device testing. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of analyzing a device under test (DUT) at a testing device in accordance with a first testing scenario for the DUT, comprising:
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retrieving a device response template for said DUT from an electronic data storage operably linked to the testing device, the device response template including a location of a pattern of parameters within a plurality of parameters, the pattern including information defining dimensions of the pattern; executing the first testing scenario in accordance with the device response template; receiving a device response from the DUT; parsing the device response using device response template, the parsing including capturing parameters within the dimensions of the pattern; and identifying variable values in correspondence to the captured parameters through parsing. - View Dependent Claims (12, 13)
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14. A computer readable storage medium encoded with computer program instructions which cause a computer to execute a method of generating a device response template at a testing device relative to a device under test (DUT), comprising:
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sending a command to the DUT from the testing device; receiving the command response at the testing device from the DUT, the command response including a plurality of parameters; patternizing the command response, including, defining a parameter pattern within the plurality of parameters in the command response; assigning a type to the pattern; creating in an electronic memory of the testing device, a device response template including a location of the pattern within the plurality of parameters, to identify the pattern in subsequent device testing.
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15. A testing device for generating a device response template relative to a device under test (DUT) operably linked to the testing device via a network, comprising:
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a data processor configured with an instruction set to generate a device response template and to perform subsequent testing of the device under test in accordance with the device response template; a network interface, responsive to the data processor to send a command to the DUT from the testing device; a graphical user interface, responsive to the data processor to present a command response received from the DUT in response to the command, the command response including a plurality of parameters, the graphical user interface presenting the command response and including a menu to identify a pattern within the plurality of parameters, the menu configured to define a pattern type and to designate sub-portions of the identified pattern as predetermined parameters; wherein the data processor receives pattern type assignments and designated sub-portions, and creates in an electronic memory of the testing device, a device response template including a location of the pattern and location of the designated sub-portions, within the plurality of parameters, for subsequent device testing.
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Specification