Capacitive plate dielectrometer method and system for measuring dielectric properties
First Claim
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1. A method for measuring dielectric properties of a test material using a capacitive plate dielectrometer device, comprising the steps of:
- obtaining a small sample of the test material having a size and shape that allows the sample test material to fit within the capacitive plate dielectrometer;
attaching a connecting cable to a measuring device and calibrating the connecting cable;
connecting the calibrated connecting cable to the capacitive plate dielectrometer;
calibrating the capacitive plate dielectrometer with a plurality of standard dielectric materials, wherein each standard dielectric material is inserted into the capacitive plate dielectrometer, and dielectric property data is collected by the measuring device for each standard dielectric material; and
,inserting the sample test material into the capacitive plate dielectrometer and collecting dielectric property data using the measuring device.
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Abstract
A capacitive plate dielectrometer method and system is provided that is used to measure dielectric properties, such as permittivity, of a small sample test material at a low frequency. The capacitive plate dielectrometer method and system calibrates the capacitive plate dielectrometer with a plurality of standard dielectric materials and the sample test material is rotated in the capacitive plate dielectrometer to allow measurement of several electric field directions.
34 Citations
20 Claims
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1. A method for measuring dielectric properties of a test material using a capacitive plate dielectrometer device, comprising the steps of:
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obtaining a small sample of the test material having a size and shape that allows the sample test material to fit within the capacitive plate dielectrometer; attaching a connecting cable to a measuring device and calibrating the connecting cable; connecting the calibrated connecting cable to the capacitive plate dielectrometer; calibrating the capacitive plate dielectrometer with a plurality of standard dielectric materials, wherein each standard dielectric material is inserted into the capacitive plate dielectrometer, and dielectric property data is collected by the measuring device for each standard dielectric material; and
,inserting the sample test material into the capacitive plate dielectrometer and collecting dielectric property data using the measuring device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of measuring the permittivity of a test material in a frequency range of from about 50 megahertz to about 600 megahertz, using a capacitive plate dielectrometer device, comprising the steps of:
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obtaining a sample of the test material having a size less than about five inches in height and less than about five inches in width; attaching a coaxial cable to a measuring device having data acquisition software and calibrating the connecting cable; connecting the calibrated connecting cable to the capacitive plate dielectrometer; calibrating the capacitive plate dielectrometer with a plurality of standard dielectric materials, wherein each standard dielectric material is inserted into the capacitive plate dielectrometer and permittivity data is collected by the measuring device for each standard dielectric material; and
,inserting the sample test material into the capacitive plate dielectrometer and collecting permittivity data using the measuring device, and wherein the sample test material is rotated in the capacitive plate dielectrometer to allow measurements of three electric field directions. - View Dependent Claims (12, 13, 14, 15)
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16. A system for measuring dielectric properties of a test material, the system comprising:
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a capacitive plate dielectrometer device; a measuring device with data acquisition software, such that the measuring device has a capability to measure frequency in the range of from about 50 megahertz to about 600 megahertz; a calibrated connecting cable for connecting the measuring device to the capacitive plate dielectrometer; a plurality of standard dielectric materials, wherein each standard dielectric material is inserted into the capacitive plate dielectrometer and dielectric property data is collected by the measuring device for each standard dielectric material; and
,a small sample of the test material having a size and shape that allows the sample to be inserted into and fit within the capacitive plate dielectrometer, such that dielectric property data of the sample is collected by the measuring device. - View Dependent Claims (17, 18, 19, 20)
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Specification