Semiconductor device having variable parameter selection based on temperature and test method
First Claim
1. A semiconductor device, comprising:
- a first temperature sensing circuit including a first temperature threshold value and coupled to receive a first temperature select value, the first temperature sensing circuit providing a first temperature indication signal;
at least one first temperature select register that provides the first temperature select value; and
the at least one first temperature select register is coupled to receive a power up detect signal that sets the first temperature select value to a predetermined state.
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Accused Products
Abstract
A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, a word line low voltage, or the like. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without comprising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined.
68 Citations
70 Claims
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1. A semiconductor device, comprising:
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a first temperature sensing circuit including a first temperature threshold value and coupled to receive a first temperature select value, the first temperature sensing circuit providing a first temperature indication signal; at least one first temperature select register that provides the first temperature select value; and the at least one first temperature select register is coupled to receive a power up detect signal that sets the first temperature select value to a predetermined state. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A semiconductor device, comprising:
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a first temperature sensing circuit including a first temperature threshold value and coupled to receive a first temperature select value, the first temperature sensing circuit providing a first temperature indication signal; at least one first temperature select register that provides the first temperature select value; and the first temperature select value is loaded into the at least one first temperature select register from external to the semiconductor device by a temperature select register load operation. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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38. A semiconductor device, comprising:
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a first temperature sensing circuit including a first temperature threshold value and coupled to receive a first temperature select value, the first temperature sensing circuit providing a first temperature indication signal; at least one first temperature select register that provides the first temperature select value; the first temperature sensing circuit is coupled to receive a first hysteresis select value and includes a first temperature hysteresis value; and at least one first hysteresis select register that provides the first hysteresis select value. - View Dependent Claims (39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54)
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55. A semiconductor device, comprising:
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a first temperature sensing circuit including a first temperature threshold value and coupled to receive a first temperature select value, the first temperature sensing circuit providing a first temperature indication signal; at least one first temperature select register that provides the first temperature select value; and the at least one first temperature select register is coupled to receive a temperature select load signal and the first temperature select value is loaded into the at least one temperature select register in response to the temperature select load signal. - View Dependent Claims (56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70)
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Specification