Semiconductor device and method of manufacturing same
First Claim
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1. A method of manufacturing a semiconductor device comprising:
- forming a field effect transistor using a semiconductor substrate;
forming an insulating film covering an end portion of a first electrode comprising a laminated metallic layers, wherein the first electrode is a part of a drain electrode or a source electrode of the field effect transistor;
performing etching with the insulating film as a mask to thin a center of the first electrode so that an inclined surface of the first electrode is exposed along an edge portion of the first electrode;
forming a layer containing an organic compound on the center and the inclined surface of the first electrode; and
forming a second electrode comprising a metallic thin film permitting permeation of light, on the layer containing an organic compound.
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Abstract
A FET is formed on a semiconductor substrate, a curved surface having a radius of curvature is formed on an upper end of an insulation, a portion of a first electrode is exposed corresponding to the curved surface to form an inclined surface, and a region defining a luminescent region is subjected to etching to expose the first electrode. Luminescence emitted from an organic chemical compound layer is reflected by the inclined surface of the first electrode to increase a total quantity of luminescence taken out in a certain direction.
155 Citations
30 Claims
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1. A method of manufacturing a semiconductor device comprising:
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forming a field effect transistor using a semiconductor substrate; forming an insulating film covering an end portion of a first electrode comprising a laminated metallic layers, wherein the first electrode is a part of a drain electrode or a source electrode of the field effect transistor; performing etching with the insulating film as a mask to thin a center of the first electrode so that an inclined surface of the first electrode is exposed along an edge portion of the first electrode; forming a layer containing an organic compound on the center and the inclined surface of the first electrode; and forming a second electrode comprising a metallic thin film permitting permeation of light, on the layer containing an organic compound. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of manufacturing a semiconductor device comprising:
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forming a field effect transistor using a semiconductor substrate; forming an insulating film covering an end portion of a first electrode comprising a metallic layer, wherein the first electrode is a part of a drain electrode or a source electrode of the field effect transistor; performing etching with the insulating film as a mask to thin a center of the first electrode so that the first electrode has an inclined surface directed toward a center of the first electrode, and the inclined surface reflects light emitted from the layer containing an organic compound; forming a layer containing an organic compound on the first electrode; and forming a second electrode comprising a metallic thin film permitting permeation of light on the layer containing an organic compound. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A method of manufacturing a semiconductor device comprising:
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forming a field effect transistor using a semiconductor substrate; forming an insulating film covering an end portion of a first electrode comprising a metallic layer, wherein the first electrode is a part of a drain electrode or a source electrode of the field effect transistor; performing etching with the insulating film as a mask to thin a center of the first electrode so that a center of the first electrode is concave-shaped to have a smaller film thickness than that of the end thereof; forming a, layer containing an organic compound on the first electrode; and forming a second electrode comprising a metallic thin film permitting permeation of light, on the layer containing an organic compound. - View Dependent Claims (14, 15, 16, 17, 18)
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19. A method of manufacturing a semiconductor device comprising:
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forming a field effect transistor using a semiconductor substrate; forming an insulating film covering an end portion of a first electrode comprising multi-metallic layers, wherein the first electrode is a part of a drain electrode or a source electrode of the field effect transistor; performing etching with the insulating film as a mask to thin a center of the first electrode so that the number of multi-metallic layers at a center of the first electrode is less than that at the end portion; forming a layer containing an organic compound on the first electrode; and forming a second electrode comprising a metallic thin film permitting permeation of light, on the layer containing an organic compound. - View Dependent Claims (20, 21, 22, 23, 24)
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25. A method of manufacturing a semiconductor device comprising:
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forming a field effect transistor using a semiconductor substrate; forming an insulating film covering an end portion of a first electrode comprising a metallic layer, wherein the first electrode is a part of a drain electrode or a source electrode of the field effect transistor; performing etching with the insulating film as a mask to thin a center of the first electrode so that the first electrode has a depression, and a bottom width of the depression is smaller than a top width of the depression; forming a layer containing an organic compound on the first electrode; and forming a second electrode comprising a metallic thin film permitting permeation of light, on the layer containing an organic compound. - View Dependent Claims (26, 27, 28, 29, 30)
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Specification