Degradation judgment circuit for secondary battery

• US 7,482,784 B2
• Filed: 07/12/2004
• Issued: 01/27/2009
• Est. Priority Date: 07/15/2003
• Status: Expired due to Fees

• Current Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Original Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Inventors: Nagaoka, Takashi
• Primary Examiner(s): Laxton; Gary L
• Assistant Examiner(s): Fantu; Yalkew
• Application Number:
  US10/890,356
• Publication Number:
  US 20050017687A1
• Time in Patent Office: 1,660 Days
• Field of Search: 320/132, 320/21, 320/134, 320/DIG.21
• US Class Current: 320/132
• CPC Class Codes: G01R 31/392 Determining battery ageing or deterioration, e.g. state of health
• CPC Class Codes: H02J 7/0047 with monitoring or indicating devices or circuits
• CPC Class Codes: H02J 7/0048 Detection of remaining charge capacity or state of charge [SOC]

Abstract

A degradation judgment circuit for a secondary battery used in a main apparatus includes a state data acquisition portion, an estimation portion, and a judgment portion. The state data acquisition portion acquires state data that shows the state of the secondary battery during a period from when the secondary battery is connected to the main apparatus to when the degradation of the secondary battery is judged. The estimation portion estimates (a) an internal resistance value at the time of judging degradation of the secondary battery or (b) a change in internal resistance value at the time of judging degradation of the secondary battery with respect to an initial internal resistance value at the time of connecting the secondary battery to the main apparatus, based on the state data. The judgment portion judges the degradation of the secondary battery based on the result of the estimation by the estimation portion.

Claims

1. A degradation judgment circuit for a secondary battery used in a main apparatus comprising:

a time measurement portion;

a state data acquisition portion;

an estimation portion; and

a judgment portion,

wherein the time measurement portion measures a connect time during which the secondary battery is connected to the main apparatus before judging degradation of the secondary battery,

wherein the state data acquisition portion acquires state data including data that shows an avenge temperature and a number of charge/discharge cycles of the secondary battery during a period from when the secondary battery is connected to the main apparatus to when degradation of the secondary battery is judged,

the estimation portion estimates an internal resistance value or a change in internal resistance value that corresponds to a combination of the connect time measured by the time measurement portion, the average temperature, and the number of charge/discharge cycles included in the state data by using data or a function that associates a combination of various values of the connect time, the average temperature, and the number of charge/discharge cycles with the internal resistance value or the change in internal resistance value, and

the judgment portion judges degradation of the secondary battery based on the result of the estimation by the estimation portion.

2. The degradation judgment circuit according to claim 1, further comprising:

wherein the state data acquisition portion comprises;

a temperature measurement portion for measuring a temperature of the secondary battery; and

an average temperature calculation portion for calculating an average temperature during a period of time that the secondary battery is connected to the main apparatus before judging degradation of the secondary battery, based on the result of the measurement by the temperature measurement portion.

3. The degradation judgment circuit according to claim 1, wherein the state data acquisition portion comprises a charge/discharge cycle counter for counting the number of charge/discharge cycles until degradation of the secondary battery is judged.

4. The degradation judgment circuit according to claim 1, wherein the state data acquisition portion comprises:

a discharge depth measurement portion for measuring a discharge depth of the secondary battery; and

an average discharge depth calculation portion for calculating an average discharge depth during the period from when the secondary battery is connected to the main apparatus to when degradation of the secondary battery is judged, based on. the result of the measurement by the discharge depth measurement portion; and

wherein the state data includes data showing the average discharge depth.

5. The degradation judgment circuit according to claim 1, further comprising:

a data table for previously storing data that shows an internal resistance value or a change in internal resistance value of the secondary battery and is based on measurement using the same type of secondary battery as the secondary battery connected to the main apparatus, the data being stored in correspondence with the state data,

wherein the estimation portion estimates (a) an internal resistance value or (b) a change in internal resistance value of the secondary battery by referring to the data table, based on the state data acquired by the state data acquisition portion.

6. The degradation judgment circuit according to claim 5, further comprising:

wherein the state data acquisition portion comprises;

a temperature measurement portion for measuring a temperature of the secondary battery; and

an average temperature calculation portion for calculating an average temperature during a period of time that the secondary battery is connected to the main apparatus before judging degradation of the secondary battery, based on the result of the measurement by the temperature measurement portion,

wherein the state data includes data showing the avenge temperature,

wherein the data table includes a time-temperature correspondence data table for previously storing time-temperature correspondence data that shows an internal resistance value or a change in internal resistance value of the secondary battery and is based on a test using the same type of secondary battery as the secondary battery, and

the time-temperature correspondence data is based on a test that examines a relationship between internal resistance of the same type of secondary battery, a time during which the same type of secondary battery is connected to the main apparatus, and a temperature of the same type of secondary battery during that time, and is stored in correspondence with both data showing the time and data showing the temperature, and

wherein the estimation portion estimates (a) an internal resistance value or (b) a change in internal resistance value of the secondary battery by referring to the time-temperature correspondence data table, based on the data showing the average temperature and the data showing the connect time.

7. The degradation judgment circuit according to claim 6, wherein the state data acquisition portion comprises a charge/discharge cycle counter for counting a number of charge/discharge cycles until degradation of the secondary battery is judged,

wherein the data table includes a charge cycle count correspondence data table for previously storing charge cycle count correspondence data that shows an internal resistance value or a change in internal resistance value of the secondary battery and is based on a test using the same type of secondary battery as the secondary battery connected to the main apparatus, and

the charge cycle count correspondence data is based on a test that examines a relationship between internal resistance and a number of charge cycles of the same type of secondary battery, and is stored in correspondence with data showing the number of charge cycles, and

wherein the estimation portion estimates (a) an internal resistance value or (b) a change in internal resistance value of the secondary battery by referring to the charge cycle count correspondence data table, based on the data showing the number of charge/discharge cycles.

8. The degradation judgment circuit according to claim 7, wherein the state data acquisition portion comprises:

a discharge depth measurement portion for measuring a discharge depth of the secondary battery; and

an average discharge depth calculation portion for calculating an average discharge depth during the period from when the secondary battery is connected to the main apparatus to when degradation of the secondary battery is judged, based on the result of the measurement by the discharge depth measurement portion;

wherein the state data includes data showing the average discharge depth,

wherein the charge cycle count correspondence data is based on a test that examines a relationship between internal resistance, a number of charge cycles, and a discharge depth of the same type of secondary battery, and is stored in correspondence with both data showing the number of charge cycles and data showing the discharge depth, and

wherein the estimation portion estimates (a) an internal resistance value or (b) a change in internal resistance value of the secondary battery by referring to the charge cycle count correspondence data table, based on the data showing the number of charge/discharge cycles and the data showing the average discharge depth.

9. The degradation judgment circuit according to claim 8, wherein the judgment portion judges degradation of the secondary battery based on at least a value estimated by referring to the time-temperature correspondence data table and a value estimated by referring to the charge cycle count correspondence data table in the estimation portion.

10. The degradation judgment circuit according to claim 1, further comprising:

an out-of-temperature range time measurement portion for measuring a period of time that a temperature of the secondary battery is outside a predetermined temperature range defined as a temperature range in normal operation; and

an out-of-temperature range defining term calculation portion for calculating an out-of-temperature range defining term based on the period of time measured by the out-of-temperature range time measurement portion and a predetermined coefficient provided in accordance with a type of the secondary battery,

wherein the judgment portion judges degradation of the secondary battery based on the result of the estimation by the estimation portion while taking into account the out-of temperature range defining term.

11. The degradation judgment circuit according to claim 1, further comprising:

a deep discharge time measurement portion for measuring a period of time that the secondary battery is in a deep discharge state based on a voltage of the secondary battery; and

a deep discharge defining term calculation portion for calculating a deep discharge defining term based on the period of time measured by the deep discharge time measurement portion and a predetermined coefficient provided in accordance with a type of the secondary battery,

wherein the judgment portion judges degradation of the secondary battery based on the result of the estimation by the estimation portion while taking into account the deep discharge defining term.

12. The degradation judgment circuit according to claim 1, further comprising:

a short-circuit time measurement portion for measuring a period of time that the secondary battery is in a short-circuit state based on a voltage of the secondary battery; and

a short-circuit defining term calculation portion for calculating a shot-circuit defining term based on the period of time measured by the short-circuit time measurement portion and a predetermined coefficient provided in accordance with a type of the secondary battery,

wherein the judgment portion judges degradation of the secondary battery based on the result of the estimation by the estimation portion while taking into account the short-circuit defining term.

13. The degradation judgment circuit according to claim 1, further comprising:

a full charge time measurement portion for measuring a period of time that the secondary battery is in a full charge state based on a capacity of the secondary battery; and

a full charge defining term calculation portion for calculating a full charge defining term based on the period of time measured by the full charge time measurement portion and a predetermined coefficient provided in accordance with a type of the secondary battery,

wherein the judgment portion judges degradation of the secondary battery based on the result of the estimation by the estimation portion while taking into account the full charge defining term.

14. A secondary battery system comprising:

the degradation judgment circuit according to claim 1; and

a secondary battery.

15. A method for judging degradation of a secondary battery used in a main apparatus comprising the steps of:

acquiring a connect time during which the secondary battery is connected to the main apparatus before judging degradation of the secondary battery;

acquiring state data including data that shows an average temperature and a number of charge/discharge cycles of the secondary battery during a period from when the secondary battery is connected to the main apparatus to when degradation of the secondary batter is judged;

estimating an internal resistance value or a change in internal resistance value that corresponds to a combination of the connect time measured by the time measurement portion, the average temperature, and the number of charge/discharge cycles included in the state data by using data or a function that associates a combination of various values of the connect time, the average temperature, and the number of charge/discharge cycles with the internal resistance value or the change in internal resistance value; and

judging degradation of the secondary battery based on the result obtained by the estimating step.