Self-refresh period measurement circuit of semiconductor device
First Claim
1. A self-refresh period measurement circuit of a semiconductor device comprising:
- a delay device configured to receive an oscillation signal that is periodically enabled after a self-refresh signal is enabled, to allow a self-refresh operation to be performed, and delay the received oscillation signal by a unit self-refresh period to output a delayed oscillation signal;
a period measurement start signal generator configured to receive the self-refresh signal and the oscillation signal, and generate a period measurement start signal for setting a time that the oscillation signal is enabled for the first time as a start time for measurement of a self-refresh period; and
a refresh period output unit configured to receive the period measurement start signal and the delayed oscillation signal from the delay device, and generate a refresh period output signal that is enabled for a period from a time that the period measurement start signal is enabled to a time that the delayed oscillation signal is enabled for the first time.
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Abstract
A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a shift register configured to receive an oscillation signal that is periodically enabled after a self-refresh signal is enabled, to allow a self-refresh operation to be performed, and delay the received oscillation signal by a unit self-refresh period to output a delayed oscillation signal, a period measurement start signal generator configured to receive the self-refresh signal and the oscillation signal and generate a period measurement start signal for setting a time that the oscillation signal is enabled for the first time as a start time for measurement of a self-refresh period, and a refresh period output unit configured to receive the period measurement start signal and the delayed oscillation signal from the shift register and generate a refresh period output signal that is enabled for a period from a time that the period measurement start signal is enabled to a time that the delayed oscillation signal is enabled for the first time.
12 Citations
11 Claims
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1. A self-refresh period measurement circuit of a semiconductor device comprising:
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a delay device configured to receive an oscillation signal that is periodically enabled after a self-refresh signal is enabled, to allow a self-refresh operation to be performed, and delay the received oscillation signal by a unit self-refresh period to output a delayed oscillation signal; a period measurement start signal generator configured to receive the self-refresh signal and the oscillation signal, and generate a period measurement start signal for setting a time that the oscillation signal is enabled for the first time as a start time for measurement of a self-refresh period; and a refresh period output unit configured to receive the period measurement start signal and the delayed oscillation signal from the delay device, and generate a refresh period output signal that is enabled for a period from a time that the period measurement start signal is enabled to a time that the delayed oscillation signal is enabled for the first time. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification