Self test device and self test method for reconfigurable device mounted board

• US 7,487,416 B2
• Filed: 06/12/2006
• Issued: 02/03/2009
• Est. Priority Date: 03/28/2006
• Status: Expired due to Fees

• Current Assignee: Fujitsu Limited
• Original Assignee: Fujitsu Limited
• Inventors: Oota, Yoshiyuki
• Primary Examiner(s): Ton; David
• Application Number:
  US11/451,053
• Publication Number:
  US 20070234160A1
• Time in Patent Office: 967 Days
• Field of Search: 326/41, 714/724, 714/725, 714/733, 714/738
• US Class Current: 714/725
• CPC Class Codes: G01R 31/31704 Design for test; Design verification concerning scan tests G01R31/318583; computer-aided design G06F30/00
• CPC Class Codes: G01R 31/31724 Test controller, e.g. BIST state machine for scan test G01R31/318555
• CPC Class Codes: G01R 31/318516 Test of programmable logic devices [PLDs]

Abstract

A self test device includes an operational element determining unit that calculates, based on operation parameters for the time of operation of a board on which a reconfigurable device is mounted, operational elements used in the devices of the board for the operation, and non-operational elements; an element assignment determining unit that assigns a self-test target from among the non-operational elements; and a testing unit that makes a test signal transmit through a test path that passes through the test target.

Claims

1. A self test device that performs a self test of a board on which a reconfigurable device is mounted, the self test performed during an operation of the board, the self test device comprising:

an element calculating unit configured to calculate non-operational elements and operational elements to be used in the reconfigurable device, based on operation parameters for a time of the operation of the board;

an element assigning unit configured to assign, from among the non-operatioal elements, an element to a self-test target; and

a testing unit configured to make a test signal transmit through a test path that passes through the self-test target to perform a test on the self-test target.

2. The self test device according to claim 1, wherein the operation parameters include an amount of data input to the board.

3. The self test device according to claim 1, further comprising a bus number calculating unit configured to calculate, based on the operation parameters, number of buses between devices, the buses necessary for the operation of the board, wherein

the element assigning unit is configured to assign the test path that passes through the self-test target and the buses, by connecting devices with the buses based on the non-operational elements and the number of the buses.

4. The self test device according to claim 1, wherein

the testing unit includes

a test data generating unit configured to generate test data using elements located on the test path to send out to the test path;

and

a test checker configured to determine a failure site on the test path based on the test data received through the test path.

5. The self test device according to claim 4, wherein

the test data includes a pseudorandom code and a fixed pattern, and

the test checker is configured to acquire a test result based on an expected value of the test data.

6. The self test device according to claim 4, wherein

the test data generating unit and the test checker are provided in a single device, and

the testing unit is configured to perform a loop back test in which the test path passes through a second device other than the device on which the test data generating unit and the test checker are provided, and is returned at the second device.

7. The self test device according to claim 4, further comprising a failure notifying unit configured to notify the failure site to the element assigning unit and an external management apparatus based on a result of the test.

8. The self test device according to claim 1, wherein

the element assigning unit is configured to reassign, when a result of the test is satisfactory, another element to the self-test target from among the non-operational elements, and to request reconfiguration of the board.

9. The self test device according to claim 1, wherein

the element assigning unit is configured to reassign, when a result of the test is unsatisfactory, an operation path of the operational elements and the test path such that the failure site is bypassed, and to request reconfiguration of the board.

10. The self test device according to claim 1, wherein

the element assigning unit is configured to assign test elements and matrix switch elements to the self-test target from among the non-operational elements.

11. A method of performing a self test of a board on which a reconfigurable device is mounted, the self test performed during an operation of the board, the method comprising:

calculating non-operational elements and operational elements to be used in the reconfigurable device, based on operation parameters for a time of the operation of the board;

assigning, from among the non-operational elements, an element to a self-test target; and

performing a test by transmitting a test signal through a test path that passes through the self-test target to perform a test on the self-test target.

12. The method according to claim 11, wherein the operation parameters include an amount of data input to the board.

13. The method according to claim 11, further comprising:

calculating, based on the operation parameters, number of buses between devices, the buses necessary for the operation of the board; and

assigning the test path that passes through the self-test target and the buses by connecting devices with the buses based on the non-operational elements and the number of the buses.

14. The self test device according to claim 11, further comprising:

generating test data using elements located on the test path to send out to the test path; and

determining a failure site on the test path based on the test data received through the test path.

15. The method according to claim 14, wherein

the test data includes a pseudorandom code and a fixed pattern, and

the performing a test includes performing the test based on an expected value of the test data to obtain a test result.

16. The method according to claim 14, wherein

the generating and the determining are performed in a single device, and

the performing a test includes performing a loop back test in which the test path passes through a second device other than the device in which the generating and the determining are performed, and is returned at the second device.

17. The method according to claim 14, further comprising notifying the failure site based on a result of the test.

18. The method according to claim 11, further comprising:

reassigning, when a result of the test is satisfactory, another element to the self-test target from among the non-operational elements; and

requesting reconfiguration of the board.

19. The method according to claim 11, further comprising:

reassigning, when a result of the test is unsatisfactory, an operation path of the operational elements and the test path such that the failure site is bypassed; and

requesting reconfiguration of the board.

20. The method according to claim 11, wherein

the assigning an element includes assigning test elements and matrix switch elements to the self-test target from among the non-operational elements.