Adjusting voltage for a phase locked loop based on temperature
First Claim
1. A method for adjusting an operation of a phase locked loop (PLL) circuit based on a sensed temperature, comprising:
- sensing an operational temperature of an integrated circuit device associated with the PLL circuit with one or more thermal sensors provided on the integrated circuit device, wherein the one or more thermal sensors are configured for use in controlling an operation of the integrated circuit device and an operation of the PLL circuit;
controlling an operation of the PLL circuit based on the operational temperature sensed by the one or more thermal sensors;
generating a compensation voltage input signal to a voltage controlled oscillator of the PLL circuit based on the operational temperature, wherein the compensation voltage input signal modifies a lock frequency range of the PLL circuit, wherein sensing an operational temperature of an integrated circuit device comprises;
generating at least one voltage using the one or more thermal sensors;
providing the at least one voltage to a thermal monitoring mechanism;
converting the at least one voltage to at least one digital value using the thermal monitoring mechanism; and
generating an operational temperature value of the integrated circuit device based on the at least one digital value, and wherein the one or more thermal sensors comprise a plurality of thermal sensors and the at least one voltage comprises a plurality of voltages, and wherein converting the plurality of voltages to at least one digital value comprises;
converting each voltage to a corresponding digital value;
generating an average digital value; and
generating the operational temperature of the integrated circuit device based on the average digital value.
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Accused Products
Abstract
A mechanism for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature.
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Citations
13 Claims
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1. A method for adjusting an operation of a phase locked loop (PLL) circuit based on a sensed temperature, comprising:
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sensing an operational temperature of an integrated circuit device associated with the PLL circuit with one or more thermal sensors provided on the integrated circuit device, wherein the one or more thermal sensors are configured for use in controlling an operation of the integrated circuit device and an operation of the PLL circuit; controlling an operation of the PLL circuit based on the operational temperature sensed by the one or more thermal sensors; generating a compensation voltage input signal to a voltage controlled oscillator of the PLL circuit based on the operational temperature, wherein the compensation voltage input signal modifies a lock frequency range of the PLL circuit, wherein sensing an operational temperature of an integrated circuit device comprises; generating at least one voltage using the one or more thermal sensors; providing the at least one voltage to a thermal monitoring mechanism; converting the at least one voltage to at least one digital value using the thermal monitoring mechanism; and generating an operational temperature value of the integrated circuit device based on the at least one digital value, and wherein the one or more thermal sensors comprise a plurality of thermal sensors and the at least one voltage comprises a plurality of voltages, and wherein converting the plurality of voltages to at least one digital value comprises; converting each voltage to a corresponding digital value; generating an average digital value; and generating the operational temperature of the integrated circuit device based on the average digital value. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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Specification