Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probes
First Claim
1. A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system, the probe card assembly comprising:
- a plurality of probes supported by a support substrate, each of the plurality of probes including an end portion extending away from the support substrate, the end portion being configured to be electrically connected to a semiconductor device to be tested; and
a dielectric strip coupled to a side of at least a portion of the plurality of probes at a position on the portion of the plurality of probes between the support substrate and the end portion of the portion of the plurality of probes.
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Accused Products
Abstract
A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system is provided. The probe card assembly includes a plurality of probes supported by a support substrate, each of the plurality of probes including an end portion extending away from the support substrate. The end portion is configured to be electrically connected to a semiconductor device to be tested. The probe card assembly also includes a dielectric sheet positioned between the support substrate and the end portion of the plurality of probes such that the probes extend through apertures defined by the dielectric sheet.
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Citations
10 Claims
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1. A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system, the probe card assembly comprising:
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a plurality of probes supported by a support substrate, each of the plurality of probes including an end portion extending away from the support substrate, the end portion being configured to be electrically connected to a semiconductor device to be tested; and a dielectric strip coupled to a side of at least a portion of the plurality of probes at a position on the portion of the plurality of probes between the support substrate and the end portion of the portion of the plurality of probes. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification