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Positioning device for a test element

  • US 7,501,097 B2
  • Filed: 08/20/2004
  • Issued: 03/10/2009
  • Est. Priority Date: 08/21/2003
  • Status: Active Grant
First Claim
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1. An analysis system having a positioning device for a test element, the positioning device comprising:

  • a support surface to support the test element;

    a position-specific surface configuration on the test element;

    a first switch component serving as a reference;

    wherein the first switch component is sitting on the support surface adjacent the test element or on a reference or a reference surface of the test element arranged on the support surface;

    a second switch component which is arranged parallel to the first switch component, wherein the second switch component sits on the position-specific surface configuration, such that the second switch component can be displaced perpendicular to the support surface depending on the configuration of the test element; and

    a switch, wherein the switch can be changed from an off position to an on position depending on a displacement of the second switch component relative to the first switch component and a plane on which the first switch component sits, said plane serving as a reference plane with respect to which the switching operation is performed.

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