Electrochemically fabricated microprobes
First Claim
1. A probe device for testing integrated circuits, comprising:
- a conductive bridging element;
a plurality of conductive contact arms, each having a first end and a second end, where the second end of each connects to the bridging element and the first end of each is configured to contact a common pad of an integrated circuit and wherein the arms are configured to cause at least one of the first ends to scrub a surface of the pad relative to at least another one of the first ends as contact between the first ends and the pad is made; and
at least one pushing element that causes the arms to separate as each of the first ends is mated to a pad.
1 Assignment
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Accused Products
Abstract
Multilayer test probe structures are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments each probe structure may include a plurality of contact arms or contact tips that are used for contacting a specific pad or plurality of pads wherein the arms and/or tips are configured in such away so as to provide a scrubbing motion (e.g. a motion perpendicular to a primary relative movement motion between a probe carrier and the IC) as the probe element or array is made to contact an IC, or the like, and particularly when the motion between the probe or probes and the IC occurs primarily in a direction that is perpendicular to a plane of a surface of the IC. In some embodiments arrays of multiple probes are provided and even formed in desired relative position simultaneously.
103 Citations
31 Claims
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1. A probe device for testing integrated circuits, comprising:
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a conductive bridging element; a plurality of conductive contact arms, each having a first end and a second end, where the second end of each connects to the bridging element and the first end of each is configured to contact a common pad of an integrated circuit and wherein the arms are configured to cause at least one of the first ends to scrub a surface of the pad relative to at least another one of the first ends as contact between the first ends and the pad is made; and at least one pushing element that causes the arms to separate as each of the first ends is mated to a pad. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 14, 15, 30)
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13. A probe device for testing integrated circuits, comprising:
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a conductive bridging element; a plurality of conductive contact arms, each having a first end and a second end, where the second end of each connects to the bridging element and the first end of each is configured to contact a common pad of an integrated circuit and wherein the arms are configured to cause at least one of the first ends to scrub a surface of the pad relative to a least another one of the first ends as contact between the first ends and the pad is made; and
.at least one pulling element that causes the arms to come together as each of the first ends is mated to the pad.
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16. A probe device for testing integrated circuits, comprising:
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a conductive bridging element; a plurality of conductive contact arms, each having a first end and a second end, where the second end of each connects to the bridging element and the first end of each is configured to contact a common pad of an integrated circuit and wherein multiple arms of the plurality of arms are configured to provide compliance between the probe device and the pad as contact between the plurality of contact arms and the pad is made; and at least one pushing element that causes the arms to separate as each of the first ends is mated to the pad. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 29, 31)
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28. A probe device for testing integrated circuits, comprising:
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a conductive bridging element; a plurality of conductive contact arms, each having a first end and a second end, where the second end of each connects to the bridging element and the first end of each is configured to contact a common pad of an integrated circuit and wherein multiple arms of the plurality of arms are configured to provide compliance between the probe device and the pad as contact between the plurality of contact arms and the pad is made; and at least one pulling element that causes the arms to come together as each of the first ends is mated to the pad.
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Specification