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Probe holder for testing of a test device

  • US 7,504,842 B2
  • Filed: 04/11/2007
  • Issued: 03/17/2009
  • Est. Priority Date: 05/28/1997
  • Status: Expired due to Fees
First Claim
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1. A system for probing a device under test comprising:

  • (a) a probing device for probing said device under test, said probing device including a first conductive area, a second conductive area, a conductive elongate probing element connected to said first conductive area in a manner suitable to probe said device under test, and said first conductive area and said second conductive area electrically isolated from one another;

    (b) a probe housing detachably engageable with said probing device;

    (c) said probe housing being engaged with both a first cable that includes a first conductor surrounded by a second conductor and a second cable including a third conductor surrounded by a fourth conductor;

    (d) a first coupler electrically interconnects said first conductor, said third conductor, and said first conductive area when said probing device is engaged with said probe housing;

    (e) a second coupler electrically interconnects said second conductor and said fourth conductor with said second conductive area when said probing device is engaged with said probe housing.

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