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Automated ellipsometer and the like systems

  • US 7,505,134 B1
  • Filed: 04/21/2006
  • Issued: 03/17/2009
  • Est. Priority Date: 01/16/2001
  • Status: Expired due to Term
First Claim
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1. A method of aligning an ellipsometer system which comprises:

  • an ellipsometer source of a beam of electromagnetic radiation;

    a stage for supporting a sample and having means for effecting tip/tilt and translation thereof;

    a data detector of electromagnetic radiation;

    said method comprising;

    a) placing an alignment sample on said stage;

    b) generally orienting said ellipsometer source of a beam of electromagnetic radiation so that it directs a beam of electromagnetic radiation onto a first location of said alignment sample at an oblique angle, which beam then reflects from said alignment sample and enters said data detector so that it provides an output signal;

    performing steps;

    c1) while monitoring the output signal from said data detector causing said stage to effect translation of said alignment sample so that said beam is directed to a second location thereon at said oblique angle, reflects therefrom and enters said data detector, followed by adjusting the tip/tilt of said stage;

    c2) while monitoring the output signal from said data detector causing said stage to effect translation of said alignment sample so that said beam is directed to a third location thereon at said oblique angle, reflects therefrom and enters said data detector, followed by adjusting the tip/tilt of said stage, said third location being other than co-linear with said first and second locations;

    c3) while monitoring the output signal from said data detector causing said stage to effect translation of said alignment sample so that said beam is directed to a said first location thereon at said oblique angle, reflects therefrom and enters said data detector, followed by adjusting the tip/tilt of said stage;

    itteratively, in any functional order, until the output of the data detector is substantially the same in all said steps c1, c2 and c3;

    with the result being that the stage is oriented in tip/tilt so that no matter from what location on said alignment sample said beam is caused to reflect, the output from said data detector remains substantially the same;

    said method then optionally further comprising;

    d) while monitoring the data detector output signal moving the location and orientation thereof until said output signal therefrom is substantially maximized.

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