Single-crystal silicon substrate, SOI substrate, semiconductor device, display device, and manufacturing method of semiconductor device
First Claim
1. A semiconductor device, comprising:
- a non-single-crystal silicon thin-film device manufactured from a non-single-crystal silicon thin film anda single-crystal silicon thin-film device manufactured from a single-crystal silicon thin film,wherein the non-single-crystal silicon thin-film device and the single-crystal silicon thin-film device are provided in different areas of an insulating substrate,wherein the non-single-crystal silicon thin-film is the first non-single-crystal silicon thin-film layer above the insulating substrate, andwherein the non-single-crystal silicon thin-film and the single-crystal silicon thin-film are each vertically separated from the insulating substrate by a space, or at least one other layer, such that a surface of the non-single-crystal silicon thin-film that is nearest to the insulating substrate and a surface of the single-crystal silicon thin-film that is nearest to the insulating substrate are at different heights above the insulating substrate.
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Accused Products
Abstract
A semiconductor device of the present invention is arranged in such a manner that a MOS non-single-crystal silicon thin-film transistor including a non-single-crystal silicon thin film made of polycrystalline silicon, a MOS single-crystal silicon thin-film transistor including a single-crystal silicon thin film, and a metal wiring are provided on an insulating substrate. With this arrangement, (i) a semiconductor device in which a non-single-crystal silicon thin film and a single-crystal silicon thin-film device are formed and high-performance systems are integrated, (ii) a method of manufacturing the semiconductor device, and (iii) a single-crystal silicon substrate for forming the single-crystal silicon thin-film device of the semiconductor device are obtained.
321 Citations
24 Claims
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1. A semiconductor device, comprising:
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a non-single-crystal silicon thin-film device manufactured from a non-single-crystal silicon thin film and a single-crystal silicon thin-film device manufactured from a single-crystal silicon thin film, wherein the non-single-crystal silicon thin-film device and the single-crystal silicon thin-film device are provided in different areas of an insulating substrate, wherein the non-single-crystal silicon thin-film is the first non-single-crystal silicon thin-film layer above the insulating substrate, and wherein the non-single-crystal silicon thin-film and the single-crystal silicon thin-film are each vertically separated from the insulating substrate by a space, or at least one other layer, such that a surface of the non-single-crystal silicon thin-film that is nearest to the insulating substrate and a surface of the single-crystal silicon thin-film that is nearest to the insulating substrate are at different heights above the insulating substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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23. A semiconductor device, comprising;
- a non-single-crystal silicon thin-film device manufactured from a non-single-crystal silicon thin film and a single-crystal silicon thin-film device manufactured from a single-crystal silicon thin film,
wherein the non-single-crystal silicon thin-film device and the single-crystal silicon thin-film device are provided in different areas of an insulating substrate, wherein the single-crystal silicon thin-film device is bonded with the insulating substrate via an intervening inorganic insulating film, wherein, the non-single-crystal silicon thin-film device is either a MOS non-single-crystal silicon thin-film transistor or a MIS non-single-crystal silicon thin-film transistor, and the single-crystal silicon thin-film device is a bipolar single-crystal silicon thin-film transistor, and wherein, a metal wiring and a contact pattern of the bipolar single-crystal silicon thin-film transistor include respective parts each being formed in accordance with a wiring rule which is more relaxed than a wiring rule of a base pattern of the bipolar single-crystal silicon thin-film transistor.
- a non-single-crystal silicon thin-film device manufactured from a non-single-crystal silicon thin film and a single-crystal silicon thin-film device manufactured from a single-crystal silicon thin film,
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24. A semiconductor device, comprising:
- a non-single-crystal silicon thin-film device manufactured from a non-single-crystal silicon thin film and a single-crystal silicon thin-film device manufactured from a single-crystal silicon thin film,
wherein the non-single-crystal silicon thin-film device and the single-crystal silicon thin-film device are provided in different areas of an insulating substrate, and wherein, a margin of alignment of at least a part of a pattern on the single-crystal silicon is fine so as to be smaller than a margin of alignment of patterns on any one of an entire surface of a mother board, a display area, and an entirety of the non-single-crystal silicon thin-film device and the single-crystal silicon thin-film device.
- a non-single-crystal silicon thin-film device manufactured from a non-single-crystal silicon thin film and a single-crystal silicon thin-film device manufactured from a single-crystal silicon thin film,
Specification