System and methods for x-ray backscatter reverse engineering of structures

• US 7,508,910 B2
• Filed: 04/25/2007
• Issued: 03/24/2009
• Est. Priority Date: 05/04/2006
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Edwards, William T., Georgeson, Gary E., Safai, Morteza
• Primary Examiner(s): SONG, HOON K
• Application Number:
  US11/739,835
• Publication Number:
  US 20070269006A1
• Time in Patent Office: 699 Days
• Field of Search: 378/189, 378 86- 89, 378/57, 378196-198
• US Class Current: 378/57
• CPC Class Codes: B64F 5/60 Testing or inspecting aircraft components or systems
• CPC Class Codes: G01N 23/203 Measuring back scattering

Abstract

A system and methods for x-ray backscatter reverse engineering of structures. One embodiment includes a plurality of articulated arms attached to a movable base. Another embodiment includes a single counterweighted arm attached to a movable base. The arms include x-ray detectors. At least one x-ray source, which may be mounted on the arm(s), emits x-rays, which are backscattered off the surfaces and objects of interest and captured by the detectors to generate images of hidden objects. The present system provides improved speed and resolution over prior art systems. The system has a field-of-view and effective scanning range versatile enough to work in various orientations and in environments of various sizes. In certain embodiments the system is compact and lightweight so that it can be easily transported and used within confined spaces or in environments where weight is a consideration, such as inside or underneath aircraft. The system is also pointable and adaptable.

Claims

1. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system compromising:

mobile base portion;

at least a first arm secured to the base at an articulation point;

at least one x-ray source; and

at least one x-ray detector configured to collect x-rays backscattered from the object;

wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, the detector is moveable with the arm about the articulation point, and the arm is linearly extensible and contractible.

2. The x-ray backscatter system of claim 1, further comprising at least a second arm secured to the base at a second articulation point.

3. The x-ray backscatter system of claim 2, wherein the first and second arms are each articulable with respect to the base, and are each articulable independently of one another.

4. The x-ray backscatter system claim 1, wherein the arm has at least one degree of rotational freedom with respect to the base.

5. The x-ray backscatter system of claim 1, wherein the arm has at least two degrees of rotational freedom with respect to the base.

6. The x-ray backscatter system of claim 1, further comprising a visual camera configured to capture an image of the surface.

7. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:

a mobile base portion;

at least a first arm secured to the base at an articulation point;

at least one x-ray source; and

at least one x-ray detector configured to collect x-rays backscattered from the object;

wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, the detector is moveable with the arm about the articulation point, and the arm further comprises a first segment, a second segment, and a joint connecting the first and second segments.

8. The x-ray backscatter system of claim 7, wherein the joint has at least one degree of freedom.

9. The x-ray backscatter system of claim 7, wherein the joint has at least two degrees of freedom.

10. The x-ray backscatter system of claim 7, further comprising at least a second arm secured to the base at a second articulation point.

11. The x-ray backscatter system of claim 10, wherein the first and second arms are each articulable with respect to the base, and are each articulable independently of one another.

12. The x-ray backscatter system of claim 7, wherein the arm has at least one degree of rotational freedom with respect to the base.

13. The x-ray backscatter system of claim 7, wherein the arm has at least two degrees of rotational freedom with respect to the base.

14. The x-ray backscatter system of claim 7, further comprising a visual camera configured to capture an image of the surface.

15. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:

a mobile base portion;

at least a first arm secured to the base at an articulation point;

at least one x-ray source; and

at least one x-ray detector configured to collect x-rays backscattered from the object;

wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, the detector is moveable with the arm about the articulation point, and the arm includes a counterweight at a location spaced from the detector and on an opposite side of the articulation point from the detector.

16. The x-ray backscatter system of claim 15, further comprising at least a second arm secured to the base at a second articulation point.

17. The x-ray backscatter system of claim 16, wherein the first and second arms are each articulable with respect to the base, and are each articulable independently of one another.

18. The x-ray backscatter system of claim 15, wherein the arm has at least one degree of rotational freedom with respect to the base.

19. The x-ray backscatter system of claim 15, wherein the arm has at least two degrees of rotational freedom with respect to the base.

20. The x-ray backscatter system of claim 15, further comprising a visual camera configured to capture an image of the surface.

21. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:

a mobile base portion;

at least a first arm secured to the base at an articulation point;

at least one x-ray source; and

at least one x-ray detector configured to collect x-rays backscattered from the object;

wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, the detector is moveable with the arm about the articulation point, the x-ray source is positioned on the arm at a location spaced from the articulation point, and the source is moveable with the arm about the articulation point.

22. The x-ray backscatter system of claim 21, further comprising at least a second arm secured to the base at a second articulation point.

23. The x-ray backscatter system of claim 22, wherein the first and second arms are each articulable with respect to the base, and are each articulable independently of one another.

24. The x-ray backscatter system of claim 21, wherein the arm has at least one degree of rotational freedom with respect to the base.

25. The x-ray backscatter system of claim 21, wherein the arm has at least two degrees of rotational freedom with respect to the base.

26. The x-ray backscatter system of claim 21, further comprising a visual camera configured to capture an image of the surface.