Test pattern compression for an integrated circuit test environment

• US 7,509,546 B2
• Filed: 09/18/2006
• Issued: 03/24/2009
• Est. Priority Date: 11/23/1999
• Status: Expired due to Fees

• Current Assignee: Siemens Industry Software Inc. (Siemens AG)
• Original Assignee: Mentor Graphics Corporation (Siemens AG)
• Inventors: Mukherjee, Nilanjan, Tyszer, Jerzy, Rajski, Janusz, Kassab, Mark
• Primary Examiner(s): TU, CHRISTINE TRINH LE
• Application Number:
  US11/523,111
• Publication Number:
  US 20070016836A1
• Time in Patent Office: 918 Days
• Field of Search: None
• US Class Current: 714/718
• CPC Class Codes: G01R 31/318335 Test pattern compression or decompression compression or decompression of scan patterns G01R31/318547; compression or decompression hardware G01R31/31921
• CPC Class Codes: G01R 31/318371 Methodologies therefor, e.g. algorithms, procedures
• CPC Class Codes: G01R 31/318547 Data generators or compressors

Abstract

A method for compressing test patterns to be applied to scan chains in a circuit under test. The method includes generating symbolic expressions that are associated with scan cells within the scan chains. The symbolic expressions are created by assigning variables to bits on external input channels supplied to the circuit under test. Using symbolic simulation, the variables are applied to a decompressor to obtain the symbolic expressions. A test cube is created using a deterministic pattern that assigns values to the scan cells to test faults within the integrated circuit. A set of equations is formulated by equating the assigned values in the test cube to the symbolic expressions associated with the corresponding scan cell. The equations are solved to obtain the compressed test pattern.

Claims

1. A computer-readable medium storing computer-executable instructions for causing a computer to perform acts comprising:

generating symbolic expressions that are associated with scan cells of an integrated circuit design, the symbolic expressions being a function of input variables of a decompressor configured to input the input variables and concurrently output decompressed test pattern bits, the act of generating the symbolic expressions comprising simulating the decompressor;

generating a test cube having at least a portion of the scan cells assigned predetermined values;

formulating a set of equations by equating the assigned values in the scan cells to the symbolic expressions; and

solving the equations to obtain a compressed test pattern.

2. The computer-readable medium of claim 1, wherein the values assigned to the scan cells are chosen to test potential faults in the integrated circuit.

3. The computer-readable medium of claim 1, wherein the computer-executable instructions further cause the computer to perform an act comprising, after solving the equations, incrementally appending the set of equations with one or more equations.

4. The computer-readable medium of claim 3, wherein the computer-executable instructions further cause the computer to perform acts comprising:

(a) attempting to solve the appended set of equations;

(b) if the attempt to solve the equations fails, deleting the most recently appended equations and appending one or more different equations onto the set of equations; and

(c) if the attempt to solve the equations is successful, incrementally appending additional equations onto the set of equations;

(d) repeating (a)-(c) until a predetermined limiting criteria is reached.

5. The computer-readable medium of claim 1, wherein the act of generating symbolic expressions comprises assigning the input variables to bits on input channels of the integrated circuit design, the number of input variables being larger than the number of channels, and wherein the act of simulating includes simulating the application of the input variables to the decompressor in the integrated circuit and simulating that the decompressor is continually clocked to decompress the input variables, wherein one or more additional input variables are injected into the decompressor during one or more clock cycles.

6. The computer-readable medium of claim 5, wherein the computer-executable instructions further cause the computer to perform an act comprising generating a set of output expressions from the decompressor that results from the simulation, wherein the output expressions are based on the input variables that are injected as the decompressor is continually clocked.

7. The computer-readable medium of claim 6, wherein the computer-executable instructions further cause the computer to perform an act comprising assigning each of the output expressions to each scan cell within a scan chain in the integrated circuit.

8. The computer-readable medium of claim 1, wherein the act of solving the equations comprises performing a Gauss-Jordon elimination method for solving equations.

9. The computer-readable medium of claim 1, wherein the act of generating a test cube comprises assigning values of a predetermined logic 1 or a predetermined logic 0 to the scan cells for testing a fault in the integrated circuit.

10. The computer-readable medium of claim 1, wherein the act of formulating the set of equations comprises:

associating each symbolic expression in a one-to-one relationship with a scan cell; and

for each scan cell having a predetermined assigned value, equating the symbolic expression associated with that scan cell to the predetermined assigned value.

11. A computer-readable medium comprising computer-executable instructions for causing a computer to perform the act of:

generating a compressed test pattern for testing an integrated circuit by using symbolic expressions associated with scan cells of the integrated circuit, the symbolic expressions including linear combinations of input variables that are to be applied to a decompressor configured to decompress the input variables into test pattern bits and configured to apply the test pattern bits to scan chains of the integrated circuit as the input variables are received.

12. The computer-readable medium of claim 11, wherein the act of generating the compressed test pattern comprises modeling the decompressor using simulation or mathematical analysis.

13. The computer-readable medium of claim 11, wherein the act of generating the compressed test pattern comprises generating a test cube that assigns predetermined values to at least some of the scan cells in order to test faults within the integrated circuit.

14. The computer-readable medium of claim 11, wherein the act of generating the compressed test pattern comprises:

generating a test cube having a portion of the scan cells assigned values;

formulating a set of equations by equating the assigned values in the scan cells to the symbolic expressions; and

solving the equations to obtain the compressed test pattern.

15. The computer-readable medium of claim 14, wherein the computer-executable instructions further cause the computer to perform an act comprising incrementally appending the set of equations with one or more equations.

16. The computer-readable medium of claim 15, wherein the computer-executable instructions further cause the computer to perform an act comprising terminating the incremental appending if the equations cannot be solved and a limiting criteria is met or exceeded.

17. The computer-readable medium of claim 15, wherein the computer-executable instructions further cause the computer to perform an act comprising attempting to solve the equations and if the equations cannot be solved, deleting the incrementally appended equations and incrementally appending one or more other equations.

18. A method, comprising:

generating a compressed test pattern for testing an integrated circuit by using symbolic expressions associated with scan cells of the integrated circuit, the symbolic expressions including linear combinations of input variables that are to be applied to a decompressor configured to decompress the input variables into test pattern bits and configured to apply the test pattern bits to scan chains of the integrated circuit as the input variables are received; and

storing the compressed test pattern.

19. The method of claim 18, wherein the act of generating the compressed test pattern comprises modeling the decompressor using simulation or mathematical analysis.

20. The method of claim 18, wherein the act of generating the compressed test pattern comprises generating a test cube that assigns predetermined values to at least some of the scan cells in order to test faults within the integrated circuit.

21. The method of claim 18, wherein the act of generating the compressed test pattern comprises:

generating a test cube having a portion of the scan cells assigned values;

formulating a set of equations by equating the assigned values in the scan cells to the symbolic expressions; and

solving the equations to obtain the compressed test pattern.