X-ray tube electron sources

• US 7,512,215 B2
• Filed: 04/23/2004
• Issued: 03/31/2009
• Est. Priority Date: 04/25/2003
• Status: Active Grant

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Inventors: Luggar, Russell David, De Antonis, Paul, Morton, Edward James
• Primary Examiner(s): Yun; Jurie
• Application Number:
  US10/554,975
• Publication Number:
  US 20070053495A1
• Time in Patent Office: 1,803 Days
• Field of Search: 378/4, 378/9, 378/10, 378/12, 378/14, 378 91- 93, 378/98.6, 378/101, 378113-116, 378/119, 378/121, 378/122, 378/124, 378134-139, 378/145, 378/146
• US Class Current: 378/136
• CPC Class Codes: H01J 2235/068 Multi-cathode assembly
• CPC Class Codes: H01J 35/04 Electrodes ; Mutual position thereof; Constructional adaptations therefor
• CPC Class Codes: H01J 35/066 Details of electron optical components, e.g. cathode cups
• CPC Class Codes: H01J 35/14 Arrangements for concentrating, focusing, or directing the cathode ray

Abstract

An X-ray tube includes an emitter wire (18) enclosed in a suppressor(14, 16). An extraction grid comprises a number of parallel wires (20) extending perpendicular to the emitter wire, and a focusing grid comprises a number of wires (22) parallel to the grid wires (20) and spaced apart at equal spacing to the grid wires (20). The grid wire are connected by means of switches to a positive extracting potential or a negative inhibiting potential, and the switches are controlled so that at any one time a pair of adjacent grid wires (22) are connected together to form an extracting pair, which produce an electron beam. The position of the beam is moved by switching different pairs of grid wires to the extracting potential.

Claims

1. An electron source for an X-ray scanner comprising:

at least one electron emitter in a first plane;

a plurality of extraction elements in a second plane, wherein the first plane and second plane are substantially parallel and separated by a contiguous space, wherein said extraction elements are substantially perpendicular to the at least one electron emitter, and wherein a space between two adjacent extraction elements and said at least one electron emitter define a source region;

a plurality of elongate focusing elements in a third plane, wherein the third plane and second plane are substantially parallel and separated by a contiguous space defining a second region and wherein said focusing elements focus beams of electrons after they have passed the extraction elements; and

a controller that applies an electrical potential to certain of said plurality of extraction elements wherein said application of the electrical potential causes electrons to be moved from a first source region to the second region.

2. An electron source according to claim 1 wherein the electron emitter comprises an elongate emitter member.

3. An electron source according to claim 2 wherein the extraction elements comprise parallel elongate members.

4. An electron source according to claim 1 wherein the controller is arranged to connect each of the plurality of extraction elements to either an extracting electrical potential which is positive with respect to the electron emitter or an inhibiting electrical potential which is negative with respect to the electron emitter.

5. An electron source according to claim 4 wherein the controller is arranged to connect the extraction elements to the extracting potential successively in adjacent pairs so as to direct a beam of electrons between each pair of extraction elements.

6. An electron source according to claim 5 wherein each of the extraction elements is connected to the same electrical potential as either of the extraction elements which are adjacent to it.

7. An electron source according to claim 5 wherein the controller connects the extraction elements to either side of an adjacent pair to the inhibiting potential while each of said adjacent pairs is connected to the extracting potential.

8. An electron source according to claim 7 wherein the controller connects all remaining extraction elements to the inhibiting potential while each of said adjacent pairs is connected to the extracting potential.

9. An electron source according to claim 4 wherein the extraction elements are spaced from the electron emitter such that if a group of one or more adjacent extraction elements are switched to the extracting potential, electrons will be extracted from a length of the electron emitter which is longer than the width of the source regions defined by said extraction elements.

10. An electron source according to claim 9 wherein the extraction elements are spaced from the electron emitter by a distance which is at least substantially equal to the distance between adjacent extraction elements.

11. An electron source according to claim 9 wherein the extraction elements are spaced from the electron emitter by a distance of 5 mm.

12. An electron source according to claim 9 wherein the extraction elements are arranged to at least partially focus the extracted electrons into a beam.

13. An electron source according to claim 1 wherein the extraction elements comprise wires.

14. An electron source according to claim 1 wherein the extraction elements are spaced from the electron emitter by a distance approximately equal to the distance between adjacent extraction elements.

15. An electron source according to claim 1 wherein the focusing elements are parallel to the extraction elements.

16. An electron source according to claim 15 wherein the focusing elements are aligned with the extraction elements such that electrons passing between any pair of the extraction elements will pass between a corresponding pair of focusing elements.

17. An electron source according to claim 16 wherein the focusing elements are spaced at equal intervals relative to the extraction elements.

18. An electron source according to claim 1 wherein the focusing elements are arranged to be connected to an electric potential which is positive with respect to the electron emitter.

19. An electron source according to claim 18 wherein the focusing elements are arranged to be connected to an electric potential which is negative with respect to the extraction elements.

20. An electron source according to claim 1 wherein the controller is arranged to control the potential applied to the focusing elements in order to control focusing of the beams of electrons.

21. An electron source according to claim 1 wherein the focusing elements comprise wires.

22. An electron source according to claim 1 wherein the source regions are formed on respective electron emitters which are electrically insulated from each other and the controller is arranged to vary the electric potential of the electron emitters to control said relative electric potentials.

23. An electron source according to claim 22 wherein the extraction elements are held at a constant potential.

24. An electron source according to claim 23 wherein said focusing elements are held at a constant potential.

25. An electron source according to claim 24 wherein the focusing elements are held at the same potential as the extraction elements.

26. An electron source according to claim 24 wherein each focusing element is spaced at a distance between and in front of each adjacent pair of electron emitters.

27. An electron source according to claim 22 wherein the electron emitter comprise emitter pads supported on an insulating emitter block.

28. An electron source according to claim 27 further comprising a layer of conductive material formed on the insulating block to provide electrical connection to the emitter pads.

29. An electron source according to claim 28 wherein the emitter pads are applied onto the layers of conductive material.

30. An electron source according to claim 27 further comprising a heating element adjacent to the emitter block.

31. An electron source according to claim 30 wherein the heating element comprises a block of insulating material with a layer of conductive material applied to it forming a heating element.

32. An electron source according to claim 27 further comprising a connecting element providing electrical connections for each of the emitter pads and flexible connecting elements providing electrical connections between the connecting element and the emitter block.

33. An electron source according to claim 32 wherein the connecting elements are arranged to accommodate relative movement of the connecting element and the emitter pad caused by thermal expansion.

34. An electron source according to claim 1 wherein the controller activates each of the source regions in turn.

35. An electron source according to claim 1 wherein the controller controls the electric potentials of the source regions and the extraction elements to extract electrons from a plurality of successive groupings of said source regions.

36. An X-ray tube comprising the electron source of claim 1 and at least one anode.

37. The at least one anode according to claim 36 further comprising an elongate anode arranged such that beams of electrons produced by different extraction elements will hit different parts of the anode.