Configurable voltage regulator
First Claim
Patent Images
1. A production testing system for testing an integrated circuit comprising:
- a control module that generates a setpoint and a value indicative of a predetermined setpoint range;
a configurable integrated circuit that receives said setpoint and said value, that has M predetermined configurations, and that generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said value, where M and N are integers greater than one and where M is greater than N; and
an integrated circuit that is tested in accordance with said N output signals of said configurable integrated circuit.
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Abstract
A production testing system for testing an integrated circuit comprises a control module that generates a setpoint and a setpoint range. A configurable integrated circuit receives the setpoint and the setpoint range, that has M predetermined configurations, and generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of the configurable integrated circuit based on the setpoint and the setpoint range, where M and N are integers greater than one and where M is greater than N. An integrated circuit is tested in accordance with the N output signals of the configurable integrated circuit.
50 Citations
30 Claims
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1. A production testing system for testing an integrated circuit comprising:
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a control module that generates a setpoint and a value indicative of a predetermined setpoint range; a configurable integrated circuit that receives said setpoint and said value, that has M predetermined configurations, and that generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said value, where M and N are integers greater than one and where M is greater than N; and an integrated circuit that is tested in accordance with said N output signals of said configurable integrated circuit. - View Dependent Claims (2, 3, 4, 5, 6, 8, 9, 10)
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7. A production testing system for testing an integrated circuit comprising:
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a control module that generates a setpoint and a setpoint range; a configurable integrated circuit that receives said setpoint and said setpoint range, that has M predetermined configurations, and that generates N successive output signals by seguentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said setpoint range, where M and N are integers greater than one and where M is greater than N; an integrated circuit that is tested in accordance with said N output signals of said configurable integrated circuit; and a clock that generates a plurality of clock frequencies for said integrated circuit, wherein said integrated circuit is tested at a first clock speed, a first setpoint and a first setpoint range and a second clock speed that is different that said first clock speed, a second setpoint that is different than said first setpoint and a second setpoint range.
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11. A method for production testing an integrated circuit comprising:
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generating a setpoint and a value indicative of a predetermined setpoint range using a control module; providing a configurable integrated circuit that receives said setpoint and said value, that has M predetermined configurations, and that generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said value, where M and N are integers greater than one and where M is greater than N; and testing an integrated circuit in accordance with said N output signals of said configurable integrated circuit. - View Dependent Claims (12, 13, 14, 15, 16, 18, 19, 20)
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17. A method for production testing an integrated circuit comprising:
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generating a setpoint and a setpoint range using a control module; providing a configurable integrated circuit that receives said setpoint and said setpoint range, that has M predetermined configurations, and that generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said setpoint range, where M and N are integers greater than one and where M is greater than N; testing an integrated circuit in accordance with said N output signals of said configurable integrated circuit; generating a plurality of clock frequencies for said integrated circuit; testing said integrated circuit at a first clock speed, a first setpoint and a first setpoint range; and testing said integrated circuit at a second clock speed that is different that said first clock speed, a second setpoint that is different than said first setpoint and a second setpoint range.
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21. A production testing system for testing an integrated circuit comprising:
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control means for generating a setpoint and a value indicative of a predetermined setpoint range; a configurable integrated circuit that receives said setpoint and said value, that has M predetermined configurations, and that generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said value, where M and N are integers greater than one and where M is greater than N; and an integrated circuit that is tested in accordance with said N output signals of said configurable integrated circuit. - View Dependent Claims (22, 23, 24, 25, 26, 28, 29, 30)
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27. A production testing system for testing an integrated circuit comprising:
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control means for generating a setpoint and a setpoint range; a configurable integrated circuit that receives said setpoint and said setpoint range, that has M predetermined configurations, and that generates N successive output signals by sequentially selecting N ones of M discrete values of an output characteristic of said configurable integrated circuit based on said setpoint and said setpoint range, where M and N are integers greater than one and where M is greater than N; an integrated circuit that is tested in accordance with said N output signals of said configurable integrated circuit; and
clock means for generating a plurality of clock frequencies for said integrated circuit,wherein said integrated circuit is tested at a first clock speed, a first setpoint and a first setpoint range and a second clock speed that is different that said first clock speed, a second setpoint that is different than said first setpoint and a second setpoint range.
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Specification