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Method and device for the subjective determination of aberrations of higher order

  • US 7,517,087 B2
  • Filed: 12/28/2007
  • Issued: 04/14/2009
  • Est. Priority Date: 01/27/2001
  • Status: Expired due to Fees
First Claim
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1. A device for a subjective determination of aberrations of higher orders in an optical system, the device comprising:

  • at least one observation channel; and

    a plurality of individual phase-plates aligned with each other and configured to be introduced into the observation channel, each phase-plate having optically active structures corresponding to a defined Zernike polynomial and to a defined amplitude of the defined Zernike polynomial, the defined Zernike polynomial having an order higher than two.

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