Method and device for the subjective determination of aberrations of higher order
First Claim
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1. A device for a subjective determination of aberrations of higher orders in an optical system, the device comprising:
- at least one observation channel; and
a plurality of individual phase-plates aligned with each other and configured to be introduced into the observation channel, each phase-plate having optically active structures corresponding to a defined Zernike polynomial and to a defined amplitude of the defined Zernike polynomial, the defined Zernike polynomial having an order higher than two.
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Abstract
A device for the subjective determination of aberrations of higher orders Xi in an optical system, in particular in an eye includes at least one observation channel into which defined plates can be introduced, the individual plates having optically active structures which correspond to a defined Zernike polynomial and to a defined amplitude, at least one order Xi of the Zernike polynomial being greater than two.
32 Citations
21 Claims
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1. A device for a subjective determination of aberrations of higher orders in an optical system, the device comprising:
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at least one observation channel; and a plurality of individual phase-plates aligned with each other and configured to be introduced into the observation channel, each phase-plate having optically active structures corresponding to a defined Zernike polynomial and to a defined amplitude of the defined Zernike polynomial, the defined Zernike polynomial having an order higher than two. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method for the subjective determination of an aberration of a special higher order X in an optical system, comprising:
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in a first step, introducing a first phase-plate into an observation channel of the optical system, the phase-plate having optically active structures corresponding to a defined Zernike polynomial having an order X and to a defined amplitude of the defined Zernike polynomial, the order X being higher than 2; in a second step, subjectively assessing a current wave deformation of the order X; and in a third step repeating the first step with a second phase-plate of different amplitude correction of the defined Zernike polynomial and repeating the second step of the subjective determination so as to select one of the first and second phase-plates that subjectively best compensates the aberration of the special higher order X. - View Dependent Claims (17, 18)
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19. A method for the subjective determination of aberrations of special higher orders X1 to Xn in an optical system, comprising:
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in a first step, introducing a first phase-plate into an observation channel of the optical system, the phase-plate having optically active structures corresponding to a defined Zernike polynomial having an order X1 and to a defined amplitude of the defined Zernike polynomial, the order X1 being higher than 2; in a second step, subjectively assessing a current wave deformation of the order X1; and in a third step repeating the first step with a second phase-plate of different amplitude correction of the defined Zernike polynomial and repeating the second step of the subjective determination so as to select one of the first and second phase-plates that subjectively best compensates the aberration of the special higher order X1 in a fourth step, successively repeating the first and second steps for each defined Zernike polynomial having an order Xn, wherein Xn is higher than X1. - View Dependent Claims (20, 21)
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Specification