Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications
First Claim
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1. An instrument comprising:
- an illumination source configured to illuminate a field of illumination on a surface of a substrate that is configured to hold a sample, the field of illumination having a diameter greater than 1 microns,a secondary lens configured to defocus light from the illumination source,an interferometer, anda detector, wherein the detector is an array detector comprising a plurality of detectors or a single detector having multiple channels,further wherein the instrument is configured to perform Fourier transform imaging without single spot scanning or without line scanning.
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Abstract
An instrument having an illumination source configured to illuminate a field of illumination on a surface of a substrate that is configured to hold a sample. The field of illumination typically has a diameter greater than 1 micron or an area greater than that of at least one pad of an array. The instrument also includes an interferometer, and a detectors. The instrument is configured to perform Fourier transform imaging without single spot scanning or without line scanning. Additionally, the instrument may include an illumination light source, an array detector and spectral processing electronics. A method of collecting Fourier transform (FT) data is also disclosed.
20 Citations
62 Claims
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1. An instrument comprising:
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an illumination source configured to illuminate a field of illumination on a surface of a substrate that is configured to hold a sample, the field of illumination having a diameter greater than 1 microns, a secondary lens configured to defocus light from the illumination source, an interferometer, and a detector, wherein the detector is an array detector comprising a plurality of detectors or a single detector having multiple channels, further wherein the instrument is configured to perform Fourier transform imaging without single spot scanning or without line scanning. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An instrument comprising:
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an illumination source configured to illuminate a field of illumination on a surface of a substrate that is configured to hold a sample, the sample comprising an array of pads, the field of illumination having an area greater than that of at least one pad of the array of pads, a secondary lens configured to defocus light from the illumination source, an interferometer; and a detector, wherein the detector is an array detector comprising a plurality of detectors or a single detector having multiple channels, and further wherein the instrument is configured to perform Fourier transform imaging without single spot scanning or without line scanning. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 60)
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35. A method of collecting Fourier transform (FT) data, comprising:
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illuminating a field of illumination in a plane containing a sample that emits an electromagnetic radiation, the field of illumination having a diameter greater than 1 microns, defocusing light from the illumination source with a secondary lens, transforming the electromagnetic radiation emitted from the sample into an interferogram, detecting an interferogram, and transforming the interferogram into an emission spectrum by calculating Fourier transformation of the interfering patterns; wherein FT data collection is performed without single spot scanning or without line scanning. - View Dependent Claims (36, 37, 38, 39, 40, 41)
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42. A method of collecting Fourier transform (FT) data, comprising:
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illuminating a field of illumination in a plane containing a sample comprising an array of pads that emit an electromagnetic radiation, the field of illumination having an area greater than that of at least one pad of the array of pads, defocusing light from the illumination source with a secondary lens, transforming the electromagnetic radiation emitted from the sample into an interferogram, detecting the interferogram, and transforming the inteferogram into an emission spectrum; and wherein the FT data collection is performed without single spot scanning or without line scanning. - View Dependent Claims (43, 44)
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45. A method of collecting Fourier Transform (FT) data with an optical imaging system, comprising:
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simultaneously exposing to an illumination source multiple pads that emit light at one or more wavelengths different from the illumination wavelength; defocusing light from the illumination source with a secondary lens; directing the emitted light from the multiple pads along a predetermined optical path; interferometrically sampling the emitted light and scanning a spectral range that includes the one or more wavelengths of the light emitted from the multiple pads; detecting with a detector the emitted light from the multiple pads simultaneously; and collecting FT data corresponding to the detected light. - View Dependent Claims (46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 61, 62)
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Specification