Method and device for controlling ionization

• US 7,522,402 B2
• Filed: 01/09/2006
• Issued: 04/21/2009
• Est. Priority Date: 01/29/2003
• Status: Expired due to Fees

• Current Assignee: 3M Innovative Properties Company (3M Company)
• Original Assignee: 3M Innovative Properties Company (3M Company)
• Inventors: Martin, Kirk Alan, Kraz, Vladimir
• Primary Examiner(s): Jackson; Stephen W
• Assistant Examiner(s): BAUER, SCOTT ALLEN
• Application Number:
  US11/329,298
• Publication Number:
  US 20060109603A1
• Time in Patent Office: 1,198 Days
• Field of Search: 361/231
• US Class Current: 361/231
• CPC Class Codes: H01T 23/00 Apparatus for generating ions to be introduced into non-enclosed gases, e.g. into the atmosphere

Abstract

A device and method for ionization control is provided. The device and method controls the ionization balance using a sensor element, a control circuit that produces output signal as a function of an input signal from the sensor and transmits that output signal to the ionizer being controlled. The device also has a mechanism for detecting rapid changes in the input signal and a mechanism for disabling changes in the control signal for the duration of presence of said rapidly-changing signal.

Claims

1. A device for measuring ionization decay, the device comprising:

a sensor element that receives an input signal corresponding to the ionization decay of an ionizer being controlled;

a charger circuit that supplies a voltage to the sensor element;

a circuit that measures the voltage on the sensor element over time;

a processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the sensor element; and

a circuit that measures the decay of the sensor element during calibration to generate a self-decay value and wherein the processing unit subtracts the self-decay value from the ionization voltage decay to provide a measurement of only the externally-caused decay.

2. A device for measuring ionization decay, the device comprising:

a sensor element that receives an input signal corresponding to the ionization decay of an ionizer being controlled;

a charger circuit that supplies a voltage to the sensor element;

a circuit that measures the voltage on the sensor element over time;

a processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the sensor element; and

a second sensor element wherein the first sensor element is positioned adjacent a location in which decay is being controlled and the second sensor element is positioned adjacent an exit point of ions within an ionizer whose decay is being determined.

3. The device of claim 2 further comprising a second device comprising the second sensor element that measures the ionization decay of an ionizer being controlled, a second charger circuit that supplies a voltage to the sensor element, a second circuit that measures the voltage on the sensor element over time and a second processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the second sensor element.

4. A device for measuring ionization decay, the device comprising:

a sensor element that receives an input signal correspondiun to the ionization decay of an ionizer being controlled;

a charger circuit that supplies a voltage to the sensor element;

a circuit that measures the voltage on the sensor element over time; and

a processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the sensor element,

wherein the processing unit further comprises an instruction for receiving several consecutive voltage measurements and an instruction for selecting a lowest ionization voltage decay calculated from the several consecutive voltage measurements.

5. A device for measuring ionization decay, the device comprising:

a sensor element that receives an input signal corresponding to the ionization decay of an ionizer being controlled;

a charger circuit that supplies a voltage to the sensor element;

a circuit that measures the voltage on the sensor element over time; and

a processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the sensor element,

wherein the processing unit further comprises an instruction that generates a control signal, responsive to the calculated ionization voltage decay, to control a fan speed of a controlled ionizer in order to control the ionization decay of the controller iomzer.

6. The device of claim 5, wherein the processing unit further comprises an instruction that generates a voltage control signal, responsive to the calculated ionization voltage decay, to control a high voltage applied to a controlled ionizer and an instruction that generates a fan speed control signal, responsive to the calculated ionization voltage decay, to control a fan speed of a controlled ionizer wherein the voltage control signal and the fan speed control signal control the ionization decay of the controller iomzer.

7. A device for measuring ionization decay, the device comprising:

a sensor element that receives an input signal corresponding to the ionization decay of an ionizer being controlled;

a charger circuit that supplies a voltage to the sensor element;

a circuit that measures the voltage on the sensor element over time;

a processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the sensor element; and

an enclosure wherein the sensor element forms a top portion of the enclosure.

8. A method for measuring ionization decay, the method comprising:

measuring the ionization decay of an ionizer being controlled;

supplying a voltage to the sensor element;

measuring the voltage on the sensor element over time;

determining the ionization voltage decay on the sensor element based on the measured voltage; and

measuring the decay of the sensor element during calibration to generate a self-decay value and wherein the determining step further comprises subtracting the self-decay value from the ionization voltage decay to provide a measurement of only the externally-caused decay.

9. A method for measuring ionization decay, the method comprising:

measuring the ionization decay of an ionizer being controlled;

supplying a voltaae to the sensor element;

measuring the voltage on the sensor element over time; and

determining the ionization voltage decay on the sensor element based on the measured voltage,

wherein the determining further comprises receiving several consecutive voltage measurements and selecting a lowest ionization voltage decay calculated from the several consecutive voltage measurements.

10. A method for measuring ionization decay, the method comprising:

measuring the ionization decay of an ionizer being controlled;

supplying a voltage to the sensor element;

measuring the voltage on the sensor element over time; and

determining the ionization voltage decay on the sensor element based on the measured voltage,

wherein the determining further comprises controlling a fan speed of a controlled ionizer in order to control the ionization decay of the controller ionizer.

11. The method of claim 10, wherein the determining further comprises controlling a high voltage applied to a controlled ionizer and controlling a fan speed of a controlled ionizer wherein the voltage control signal and the fan speed control signal control the ionization decay of the controller ionizer.

12. A device for measuring ionization decay, the device comprising:

an enclosure;

a sensor element, that forms a top portion of the enclosure, that receives an input signal corresponding to the ionization decay of an ionizer being controlled;

a charger circuit that supplies a voltage to the sensor element;

a circuit that measures the voltage on the sensor element over time; and

a processing unit that receives the measured voltage on the sensor element and calculates the ionization voltage decay on the sensor element.