Method of and system for simulating a light-emitting device

• US 7,523,028 B2
• Filed: 10/23/2007
• Issued: 04/21/2009
• Est. Priority Date: 11/30/2006
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Nakamura, Hajime
• Primary Examiner(s): Rodriguez; Paul L
• Assistant Examiner(s): Jacob; Mary C
• Application Number:
  US11/877,081
• Publication Number:
  US 20080133188A1
• Time in Patent Office: 546 Days
• Field of Search: 703/13
• US Class Current: 703/13
• CPC Class Codes: G06F 2111/08 Probabilistic or stochastic CAD
• CPC Class Codes: G06F 2111/10 Numerical modelling
• CPC Class Codes: G06F 2119/06 Power analysis or power optimisation
• CPC Class Codes: G06F 30/20 Design optimisation, verification or simulation optimisation, verification or simulation of circuit designs G06F30/30

Abstract

A method for simulating characteristics of a light-emitting device by calculating optical and electrical properties of the light-emitting device includes steps of calculating a concentration of excitons in the light-emitting device and calculating data sets including a first data set comprising a light extraction efficiency, a second data set comprising a total emission power factor of excitons, a third data set comprising a photometric quantity and a fourth dataset comprising an emission power factor and a power reflector. The method further includes calculating a device characteristic of the light-emitting device in a measurable dimension.

Claims

1. A method of simulating a plurality of characteristics of a light-emitting device, executed on a computer device, comprising:

calculating a plurality of data sets using the computer device including a first data set comprising a light extraction efficiency, a second data set comprising a total emission power factor of excitons, a third data set comprising a photometric quantity and a fourth dataset comprisinq an emission power factor and a power reflector;

storing said plurality of data sets in a first storage device;

calculating a concentration of carriers in the light-emitting device using the computer device and for storing a carrier recombination rate as an exciton formation rate in a second storage device;

reading the exciton formation rate and the second data set

calculating using the computer device a concentration of excitons using a total deactivation speed of an exciton; and

calculating, using the computer device, and displaying on a display device, device characteristics of the light-emitting device in a measurable dimension by using a data set, selected from the plurality of data sets other than the second data set and an emission deactivation rate, calculated from the concentration of excitons;

wherein calculating said first data set comprises calculating the light extraction efficiency as a function of a wavelength and a position, the light extraction efficiency responsive to a fraction of dipoles from a plurality of dipoles having a moment parallel to a light-emitting surface;

wherein calculating said second data set comprises evaluating a wavelength integral of a light extraction efficiency;

wherein calculating said third data set comprises calculating a photometric quantity using a luminous intensity in a front direction and a total luminous flux emitted; and

wherein calculating said fourth data set comprises calculating an exciton emission energy spectrum responsive to a reflection loss caused by external light by determining a power corresponding to an amount of light reflected in an incident direction using a Fresnel coefficient.

2. The simulation method as claimed in claim 1, wherein the calculating the concentration of excitons includes:

reading the total emission power factor stored in the storage device;

performing a numerical analysis of simultaneous differential equations including the exciton formation rate speed to calculate the concentration of excitons; and

associating the concentration of excitons with the position coordinates within the light-emitting; and

storing results of said associating, as matrix data in the storage device, in order to calculate the emission deactivation rate of excitons.

3. The simulation method according to claim 1, wherein the step for calculating the concentration of excitons includes calculating the concentration of excitons using a quantum efficiency when the excitons undergo a nonradiative deactivation.