Multiple axis multipoint non-contact measurement system

• US 7,525,114 B2
• Filed: 03/16/2007
• Issued: 04/28/2009
• Est. Priority Date: 02/14/2006
• Status: Active Grant

• Current Assignee: LMI Technologies Inc.
• Original Assignee: LMI Technologies Inc.
• Inventors: Metcalfe, Leonard, Arden, Terry
• Primary Examiner(s): Sohn; Seung C
• Application Number:
  US11/687,506
• Publication Number:
  US 20070210240A1
• Time in Patent Office: 774 Days
• Field of Search: 250/206.1, 250/559.29, 250/559.31, 250/559.38, 356/3.1, 356/3.12, 356/602
• US Class Current: 250/559.31
• CPC Class Codes: G01B 11/026 by measuring distance between sensor and object G01B11/0608 takes precedence

Abstract

Apparatus for optically measuring a remote object comprises at least one source for projecting a plurality of discrete zones of electromagnetic radiation (for example laser spots) along a projection plane. Imaging apparatus images a plurality of reflections from the remote object. By spatially offsetting the imaging apparatus from the projection plane, crosstalk between opposing cameras imaging the same object is more easily avoided. The same effect as spatially offsetting the imager can be achieved by rotating the light source to provide a reflection axis that is not perpendicular to the optical axis.

Claims

1. A method for optically determining the spatial or dimensional characteristics of at least one remote object, comprising:

projecting onto said object a plurality of discrete zones of electromagnetic radiation along a single common projection plane from a first side of said object, said projection plane intersecting at least one surface of said object;

projecting onto said object a plurality of discrete zones of electromagnetic radiation along said projection plane from a side of said object that is opposite to said first side; and

,

acquiring an image of a plurality of reflections of said zones from said at least one remote object from imaging apparatus that is spatially offset from said projection plane.

2. The method of claim 1 further comprising the use of at least two optical triangulation sensors for accomplishing said steps of projecting and acquiring, said sensors being disposed on opposite sides of said object and each of said sensors comprising an enclosure containing means for projecting said discrete zones of electromagnetic radiations and a camera in said enclosure that is spatially offset from said projection means.

3. A system for imaging at least two sides of an object comprising:

a first housing comprising at least one laser source for projecting a plurality of discrete zones of laser light along a single common projection plane toward said object and a camera spatially offset from said projection plane;

a second housing comprising at least one laser source for projecting a plurality of discrete zones of laser light along said projection plane toward said object and a camera spatially offset from said projection plane; and

,

said first and second housings being disposed on opposite sides of said object, said projection plane being a common projection plane for each of said laser sources, and said first and second housings being disposed so that their respective laser sources project along said common projection plane.

4. The system of claim 3 wherein each of said cameras comprises a two-dimensional CCD array.

5. Optical triangulation measuring apparatus comprising:

a housing having an optical axis;

at least one source disposed along said optical axis within said housing for projecting a plurality of discrete zones of electromagnetic radiation;

imaging apparatus disposed substantially along said optical axis within said housing for imaging the reflections of said zones from an object; and

,

wherein said source is configured to project said zones along a reflection axis, said reflection axis not being perpendicular to said optical axis.