Multiple reference non-invasive analysis system

• US 7,526,329 B2
• Filed: 12/29/2004
• Issued: 04/28/2009
• Est. Priority Date: 08/19/2004
• Status: Active Grant

• Current Assignee: Compact Imaging, Inc.
• Original Assignee: FP-Technology Oy
• Inventors: Wilson, Carol Jean, Hogan, Josh N.
• Primary Examiner(s): WINAKUR, ERIC FRANK
• Application Number:
  US11/025,698
• Publication Number:
  US 20060063985A1
• Time in Patent Office: 1,581 Days
• Field of Search: 600/310, 600/316, 600/473, 600/476, 600/322, 356/450, 356/451, 356/456, 356/477, 356/479
• US Class Current: 600/316
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/0066 Optical coherence imaging
• CPC Class Codes: A61B 5/14532 for measuring glucose, e.g. by tissue impedance measurement
• CPC Class Codes: A61B 5/1455 using optical sensors, e.g. spectral photometrical oximeters

Abstract

A non-invasive imaging and analysis system suitable for measuring concentrations of specific components, such as blood glucose concentration and suitable for non-invasive analysis of defects or malignant aspects of targets such as cancer in skin or human tissue, includes an optical processing system which generates a probe and composite reference beam. The system also includes a means that applies the probe beam to the target to be analyzed and modulates at least some of the components of the composite reference beam such that signals with different frequency content are generated. The system combines a scattered portion of the probe beam and the composite beam interferometrically to simultaneously acquire information from multiple depths within a target. It further includes electronic control and processing systems.

Claims

1. A method for non-invasive analysis of a target comprising:

generating a probe beam and a reference beam;

separating the reference beam into multiple component reference beams;

modulating at least some of the multiple component reference beams;

re-combining, by at least some of the elements that separated said multiple component reference beams, at least part of some of the multiple component reference beams to form a composite reference beam;

applying the probe beam to the target to be analyzed;

capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;

combining the captured scattered probe radiation and the composite reference beam;

detecting the resulting composite interferometric signal to form a composite electronic signal;

separating the composite electronic signal into signals related to concurrent information from different locations within the target; and

processing said concurrent information to achieve non-invasive analysis of the target.

2. The method of claim 1, wherein the probe and reference beams are generated by at least one super-luminescent diode.

3. The method of claim 1, wherein the probe and reference beams are generated by at least one source of broadband radiation.

4. The method of claim 1, wherein the reference beam is separated into component reference beams by at least one beam-splitter.

5. The method of claim 1, wherein the reference beam is separated into component reference beams by a polarization sensitive reflective element.

6. The method of claim 1, wherein the reference beam is separated into component reference beams by a partially reflective element.

7. The method of claim 1, wherein the reference beam is separated into component reference beams by at least one optical fiber coupler.

8. The method of claim 1, wherein the reference beam is separated into component reference beams by a MEMS based mirror array.

9. The method of claim 1, wherein component reference beams are modulated by one or more phase modulators.

10. The method of claim 1, wherein component reference beams are modulated by one or more length modulators.

11. The method of claim 1, wherein different component reference beams are modulated in a manner that results in interferometric signals with different frequency content.

12. The method of claim 11, wherein at least some aspects of the different frequency content are harmonically related.

13. The method of claim 1, wherein the signals related to different component reference beams are separated by electronic processing of the detected composite electronic signal.

14. The method of claim 1, wherein the signals related to the different component reference beams are separated by digital signal processing of the detected composite electronic signal.

15. The method of claim 1, wherein the concurrent information from different locations is processed to provide scattering information.

16. The method of claim 15, wherein the scattering information is analyzed to determine a measurement of an analyte.

17. The method of claim 16, wherein the measurement of an analyte is the concentration level of glucose in tissue.

18. The method of claim 1, wherein the concurrent information from different locations is analyzed to provide imaging information.

19. The method of claim 1, wherein the reference beam is seperated into component reference beams and at least a portion of the component reference beams are re-combined into the coposite reference beam by the combination of at least one partially reflective element and at least one substantially fully reflective element.

20. The method of claim 19, wherein at least one substantially fully reflective element is a modulating reflective element.

21. The method of claim 19, wherein at least one partially reflective element is a modulating reflective element.

22. A system for non-invasive analysis of a target, said system comprising:

a source operable to generate broadband radiation;

a beam splitter operable to separate said broadband radiation into a probe beam and a reference beam;

a partially reflective surface operable to separate said reference beam into multiple component reference beams and operable to re-combine at least part of some of said multiple component reference beams to form a composite reference beam;

a modulating reflective element operable to modulate at least some of said multiple component reference beams;

an optical element operable to apply said probe beam to the target to be analyzed;

a beam splitter operable to combine at least part of said probe beam scattered from within the target with at least part of said composite reference beam;

a detector operable to detect a composite interferometric signal, said composite interferometric signal resulting from detection of at least part of said probe beam scattered from within the target and at least part of said composite reference beam, and operable to form a composite electronic signal; and

,

a processing module operable to separate said composite electronic signal into signals related to concurrent information from different locations and

operable to process said concurrent information to achieve non-invasive analysis of the target.

23. An apparatus for non-invasive analysis of a target, said apparatus comprising:

means for generating a probe beam and a reference beam;

means for separating the reference beam into multiple component reference beams;

means for modulating at least some of the multiple component reference beams;

means for re-combining at least part of some of the multiple component reference beams by at least some of the elements that separated such multiple component reference beams to form a composite reference beam;

means for applying the probe beam to the target to be analyzed;

means for capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;

means for combining the captured scattered probe radiation and the composite reference beam;

means for detecting the resulting composite interferometric signal to form a composite electronic signal;

means for separating the composite electronic signal into signals related to concurrent information from different locations; and

means for processing said concurrent information, wherein said means for processing said simultaneous information enables non-invasive analysis of the target.

24. The apparatus of claim 23, wherein the probe and reference beams are generated by at least one super-luminescent diode.

25. The apparatus of claim 23, wherein the probe and reference beams are generated by at least one source of broadband radiation.

26. The apparatus of claim 23, wherein the reference beam is separated into component reference beams by at least one beam-splitter.

27. The apparatus of claim 23, wherein the reference beam is separated into component reference beams by a polarization sensitive reflective element.

28. The apparatus of claim 23, wherein the reference beam is separated into component reference beams by a partially reflective element.

29. The apparatus of claim 23, wherein the reference beam is separated into component reference beams by at least one optical fiber coupler.

30. The apparatus of claim 23, wherein the reference beam is separated into component reference beams by a MEMS based mirror array.

31. The apparatus of claim 23, wherein component reference beams are modulated by one or more phase modulators.

32. The apparatus of claim 23, wherein component reference beams are modulated by one or more length modulators.

33. The apparatus of claim 23, wherein different component reference beams are modulated in a manner that results in interferometric signals with different frequency content.

34. The apparatus of claim 33, wherein at least some aspects of the different frequency content are harmonically related.

35. The apparatus of claim 23, wherein the signals related to different component reference beams are separated by electronic processing of the detected composite electronic signal.

36. The apparatus of claim 23, wherein the signals related to the different component reference beams are separated by digital signal processing of the detected composite electronic signal.

37. The apparatus of claim 23, wherein the concurrent information from different locations is processed to provide scattering information.

38. The apparatus of claim 37, wherein the scattering information is analyzed to determine a measurement of an analyte.

39. The apparatus of claim 38, wherein the measurement of an analyte is the concentration level of glucose in tissue.

40. The apparatus of claim 23, wherein the concurrent information from different locations is analyzed to provide imaging information. fully reflective element.

41. The apparatus of claim 23, wherein the reference beam is separated into component reference beams and at least a portion of the component reference beams are re-combined into the composite reference beam by the combination of at least one partially reflective element and at least one substantially fully reflective element.

42. The apparatus of claim 41, wherein at least one substantially fully reflective element is a modulating reflective element.

43. The apparatus of claim 41, wherein at least one partially reflective element is a modulating reflective element.