Particle detection using fluorescence

• US 7,531,363 B2
• Filed: 12/30/2003
• Issued: 05/12/2009
• Est. Priority Date: 12/30/2003
• Status: Expired due to Fees

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Gu, Yuandong, Cole, Barrett E.
• Primary Examiner(s): Griffin; Walter D
• Assistant Examiner(s): Mui; Christine T
• Application Number:
  US10/748,398
• Publication Number:
  US 20050147533A1
• Time in Patent Office: 1,960 Days
• Field of Search: 422/3, 324/76.36, 73/280.5, 435/7.92, 250/458.1, 250/461.1, 436/86, 436/151, 436/172, 356/454, 356/326, 356/72, 359/198, 374/10, 378/45
• US Class Current: 436/172
• CPC Class Codes: G01N 15/0612 Optical scan of the deposits G01N15/0625 takes precedence
• CPC Class Codes: G01N 2021/6482 Sample cells, cuvettes
• CPC Class Codes: G01N 21/0332 with temperature control control of temperature G05D23/00; cryostats F17C3/08
• CPC Class Codes: G01N 21/6456 Spatial resolved fluorescence measurements; Imaging
• CPC Class Codes: G01N 21/6486 Measuring fluorescence of biological material, e.g. DNA, RNA, cells G01N21/6428 takes precedence

Abstract

Detection systems and methods for capturing and analyzing particles within a particle sample are provided. The detection system may include, for example, a particle concentrator that can be used to collect and concentrate particles on a sample collection surface, an energy source for providing energy to induce fluorescence in the particles, and a detector for detecting at least some fluorescence induced in the particles by the energy source. The detection system may include a heater and/or cooler for controlling the temperature of the particle sample during testing.

Claims

1. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

a substrate adapted to mount the sample collection surface, the sample collection surface being at least partially thermally isolated from the substrate;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence.

2. The particle analyzer of claim 1, further comprising temperature modifying means thermally coupled to the sample collection surface.

3. The particle analyzer of claim 2, wherein the temperature modifying means comprises heating means.

4. The particle analyzer of claim 2, wherein the temperature modifying means comprises cooling means.

5. The particle analyzer of claim 2, wherein the energy source provides energy that induces at least some excitation fluorescence in a material of interest.

6. The particle analyzer of claim 2, wherein the detector is adapted and configured to detect excitation fluorescence while being at least substantially blind to reflective energy from the energy source.

7. The particle analyzer of claim 2, wherein the detector is adapted and configured to detect excitation fluorescence while being positioned at an angle relative to the sample collection surface such that reflective energy from the energy source does not impinge upon the detector.

8. The particle analyzer of claim 2, wherein the detector is sensitive to a plurality of wavelengths.

22. The particle analyzer of claim 1, wherein the particle concentrator is adapted to provide mass sorted particles to the sample collection surface.

23. The particle analyzer of claim 1, wherein the energy source provides energy that induces at least some excitation fluorescence in a material of interest.

24. The particle analyzer of claim 1, further comprising a controller that is configured to control operation of the energy source and the detector.

25. The particle analyzer of claim 1 further comprising a chemical controller for selectively adding one or more chemicals to the sample collection surface.

9. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator, the sample collection surface comprising carbon nanotubes;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence.

10. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface;

an energy source lens adapted to direct the energy from the energy source to at least a portion of the sample collection surface; and

a detector adapted to detect the induced fluorescence.

11. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface;

a detector adapted to detect the induced fluorescence; and

a detection lens adapted to focus induced fluorescence on the detector.

12. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence, the detector comprising an array of pixels.

13. The particle analyzer of claim 12, wherein at least some of the pixels of the array of pixels are sensitive to a plurality of wavelengths, and are configured to provide a spatially resolved image.

14. The particle analyzer of claim 12, wherein at least some of the pixels of the array of pixels are sensitive to a single wavelength band.

15. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence, wherein the detector includes a plurality of pixels sensitive to ultraviolet light and a plurality of pixels sensitive to visible light.

16. The particle analyzer of claim 15, wherein the plurality of pixels sensitive to ultraviolet light are arranged in a first linear array and the plurality of pixels sensitive to visible light are arranged in a second linear array.

17. The particle analyzer of claim 15, wherein at least some of the pixels sensitive to ultraviolet light and at least some of the pixels sensitive to visible light are positioned in an array in pair-wise fashion.

18. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface;

a detector adapted to detect the induced fluorescence; and

a controller that is configured to control operation of the energy source and the detector;

wherein the controller is further configured to control a temperature modifying means that is thermally coupled to the sample collection surface in accordance with a programmed or programmable temperature profile.

19. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface;

a detector adapted to detect the induced fluorescence; and

a humidity controller for controlling the humidity level around the sample collection surface.

20. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface;

a detector adapted to detect the induced fluorescence; and

a pH controller for controlling the pH level at the sample collection surface.

21. The particle analyzer of claim 20, further comprising a chemical controller for selectively adding one or more chemicals to the sample collection surface.

26. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence;

wherein the sample collection surface comprises an adsorbate.

27. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence;

wherein the detector is adapted and configured to detect excitation fluorescence while being at least substantially blind to reflective energy from the energy source.

28. The particle analyzer of claim 27, wherein the detector is adapted and configured to detect excitation fluorescence while being positioned at an angle relative to the sample collection surface such that reflective energy from the energy source does not impinge upon the detector.

29. A particle analyzer, comprising:

a particle concentrator adapted to collect and concentrate particles found within an aerosol;

a sample collection surface adapted to accept particles provided by the particle concentrator;

an energy source that provides energy that is adapted to induce fluorescence in the particles held by the sample collection surface; and

a detector adapted to detect the induced fluorescence;

wherein the detector is sensitive to a plurality of wavelengths.

30. A particle analyzer device, comprising:

a substrate;

a sample collection surface disposed over the substrate for collecting particles provided to the particle analyzer device; and

temperature adjusting means thermally coupled to the sample collection surface for adjusting the temperature of the sample collection surface.

31. The particle analyzer device of claim 30, wherein the sample collection surface is at least partially thermally isolated from the substrate.

32. The particle analyzer device of claim 30, wherein the substrate includes a cavity, and the sample collection surface is at least partially suspended over the cavity.

33. The particle analyzer device of claim 32, further comprising a support member at least partially suspended over the cavity, where the sample collection surface is disposed on the support member.

34. The particle analyzer device of claim 33, wherein the support member comprises one or more legs connecting the support member to the substrate.

35. The particle analyzer device of claim 33, wherein the temperature adjusting means is disposed adjacent to or within the support member.

36. The particle analyzer device of claim 32, wherein the substrate comprises a silicon wafer.

37. The particle analyzer device of claim 30, wherein the temperature adjusting means comprises a resistive heater.

38. The particle analyzer device of claim 30, wherein the temperature adjusting means comprises a thermoelectric cooling element.

39. The particle analyzer device of claim 30, wherein the sample collection surface comprises an adsorbate.

40. The particle analyzer device of claim 30, wherein the sample collection surface comprises carbon nanotubes.