Semiconductor device including a memory cell with a negative differential resistance (NDR) device
First Claim
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1. A semiconductor device comprising:
- at least one memory cell comprising a negative differential resistance (NDR) device and a control gate coupled thereto;
said NDR device comprising a superlattice including a plurality of stacked groups of layers with each group of layers of said superlattice comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions.
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Abstract
A semiconductor device may include at least one memory cell comprising a negative differential resistance (NDR) device and a control gate coupled thereto. The NDR device may include a superlattice including a plurality of stacked groups of layers, with each group of layers of the superlattice including a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions.
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Citations
24 Claims
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1. A semiconductor device comprising:
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at least one memory cell comprising a negative differential resistance (NDR) device and a control gate coupled thereto; said NDR device comprising a superlattice including a plurality of stacked groups of layers with each group of layers of said superlattice comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A semiconductor device comprising:
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at least one memory cell comprising a thyristor, a control gate coupled to said thyristor, and an access transistor coupled to said thyristor; said thyristor comprising a plurality of stacked semiconductor layers having alternating first and second conductivity types, and at least one layer of said stack of semiconductor layers comprising a superlattice; said superlattice including a plurality of stacked groups of layers with each group of layers of said superlattice comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions. - View Dependent Claims (16, 17, 18, 19)
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20. A semiconductor device comprising:
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a thyristor comprising plurality of stacked semiconductor layers having alternating first and second conductivity types; and a control gate coupled to said thyristor; at least one of said layers of said stack of semiconductor layers comprising a superlattice including a plurality of stacked groups of layers with each group of layers of said superlattice comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions. - View Dependent Claims (21, 22, 23, 24)
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Specification