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Inspection method and inspection apparatus

  • US 7,532,018 B2
  • Filed: 01/21/2005
  • Issued: 05/12/2009
  • Est. Priority Date: 03/19/2001
  • Status: Active Grant
First Claim
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1. A semiconductor device comprising:

  • a first circuit comprising a thin film transistor, wherein the first circuit is formed on a substrate;

    a second circuit comprising a resistor and a capacitor, wherein the second circuit is electrically connected to the first circuit and formed on the substrate; and

    a coil for receiving an AC signal, wherein the coil is electrically connected to the second circuit and formed on the substrate.

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