Interface for testing semiconductors
First Claim
1. A probing system for a device under test comprising:
- (a) an objective lens sensing said device under test;
(b) an imaging device sensing a first video sequence including multiple frames of an overlapping region of said device under test;
(c) providing a video signal to a display including said multiple frames of said overlapping region of said device under test;
(d) an operator indicating a region of said video signal of devices under test and said system in response presenting an enlarged view of a plurality of different regions of said device under test in a plurality of windows free from user input, where said region and said plurality of different regions are simultaneously displayed on said display.
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Accused Products
Abstract
A system includes an imaging device suitable for effectively positioning a probe for testing a semiconductor wafer. The system includes an objective lens for sensing the device under test and an imaging device sensing a first video sequence including multiple frames of an overlapping region of the device under test. A video signal is provided to a display including multiple frames of the overlapping region of the device under test. An operator indicating a region of the video signal of devices under test and the system in response presenting an enlarged view of a plurality of different regions of the device under test in a plurality of windows free from user input, where the region and the plurality of different regions are simultaneously displayed on the display.
1083 Citations
14 Claims
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1. A probing system for a device under test comprising:
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(a) an objective lens sensing said device under test; (b) an imaging device sensing a first video sequence including multiple frames of an overlapping region of said device under test; (c) providing a video signal to a display including said multiple frames of said overlapping region of said device under test; (d) an operator indicating a region of said video signal of devices under test and said system in response presenting an enlarged view of a plurality of different regions of said device under test in a plurality of windows free from user input, where said region and said plurality of different regions are simultaneously displayed on said display. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for displaying video for a probing system for a device under test comprising:
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(a) receiving a video signal of a device under test including multiple frames of overlapping regions of said device under test; (b) presenting said video signal in a first window on a display including said multiple frames of said overlapping regions of said device under test; (c) an operator indicating a region of said video signal of devices under test and said system in response presenting an enlarged view of a plurality of different regions of said device under test in a plurality of windows free from user input, where said region and said plurality of different regions are simultaneously displayed on said display. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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Specification