Nanometer scale data storage device and associated positioning system

• US 7,535,817 B2
• Filed: 01/03/2006
• Issued: 05/19/2009
• Est. Priority Date: 07/24/1995
• Status: Expired due to Fees

• Current Assignee: Terraspan LLC
• Original Assignee: General Nanotechnology LLC
• Inventors: Kley, Victor B.
• Primary Examiner(s): Hindi, Nabil Z
• Application Number:
  US11/325,248
• Publication Number:
  US 20060239129A1
• Time in Patent Office: 1,232 Days
• Field of Search: 369/126
• US Class Current: 369/126
• CPC Class Codes: G01B 7/31 for testing the alignment of axes
• CPC Class Codes: G01Q 80/00 Applications, other than SPM, of scanning-probe techniques manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08
• CPC Class Codes: G03F 1/84 Inspecting
• CPC Class Codes: G03F 7/70375 Multiphoton lithography or multiphoton photopolymerization; Imaging systems comprising means for converting one type of radiation into another type of radiation
• CPC Class Codes: G03F 7/70483 Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
• CPC Class Codes: G11B 11/007 with reproducing by means directly associated with the tip of a microscopic electrical probe as defined in G11B9/14 details of heads G11B9/1409; disposition or mounting of heads G11B9/1418
• CPC Class Codes: G11B 11/05 with reproducing by capacitive means G11B9/07 takes precedence
• CPC Class Codes: G11B 11/12 using recording by optical means G11B11/03 takes precedence G11B11/10 takes precedence
• CPC Class Codes: G11B 11/16 using recording by mechanical cutting, deforming or pressing G11B11/002 takes precedence
• CPC Class Codes: G11B 2005/0002 Special dispositions or recording techniques
• CPC Class Codes: G11B 2005/0021 Thermally assisted recording using an auxiliary energy source for heating the recording layer locally to assist the magnetization reversal
• CPC Class Codes: G11B 5/232 Manufacture of gap
• CPC Class Codes: G11B 5/3116 Shaping of layers, poles or gaps for improving the form of the electrical signal transduced, e.g. for shielding, contour effect, equalizing, side flux fringing, cross talk reduction between heads or between heads and information tracks G11B5/3113, G11B5/245 take precedence
• CPC Class Codes: G11B 9/06 using record carriers having variable electrical capacitance; Record carriers therefor G11B9/02 takes precedence
• CPC Class Codes: G11B 9/08 using electrostatic charge injection; Record carriers therefor
• CPC Class Codes: G11B 9/14 using microscopic probe means , i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information marking using electrical current B41M5/20; measuring roughness or irregularity of surfaces G01B7/34; details of scanning-probe microscopes G01Q
• CPC Class Codes: G11B 9/1409 Heads
• CPC Class Codes: G11B 9/1418 Disposition or mounting of heads or record carriers G11B17/00 and G11B19/00 take precedence
• CPC Class Codes: G11B 9/1427 with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
• CPC Class Codes: G11B 9/1436 with provision for moving the heads or record carriers relatively to each other
• CPC Class Codes: G11B 9/1445 : switching at least one head in operating function; Controlling the relative spacing to keep the head operative, e.g. for allowing a tunnel current flow
• CPC Class Codes: G11B 9/1454 : Positioning the head or record carrier into or out of operative position or across information tracks; Alignment of the head relative to the surface of the record carrier G11B9/1445 takes precedence
• CPC Class Codes: G11B 9/149 : characterised by the memorising material or structure
• CPC Class Codes: H02N 1/006 : of the gap-closing type H02N1/004 takes precedence
• CPC Class Codes: Y10S 977/851 : Particular movement or positioning of scanning tip
• CPC Class Codes: Y10S 977/86 : Scanning probe structure
• CPC Class Codes: Y10S 977/875 : with tip detail
• CPC Class Codes: Y10S 977/877 : Chemically functionalized

Abstract

A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising microfabricated first and second positioning assemblies. The positioning system further comprises a controller to position a positionable support structure of the first positioning assembly in a first predefined direction within a range of positioning that is larger than the range of movement of a moveable support structure of the first positioning assembly by controlling (A) a stationary support structure clamp in clamping and unclamping the positionable structure to and from the support structure, (B) a moveable structure clamp in clamping and unclamping the positionable support structure to and from the moveable support structure, and (C) the movement of the moveable support structure.

Claims

1. A data storage device comprising:

a deformable storage medium adapted to store data in the form of one or more indentations mechanically impressed thereon;

a plurality of heat probes for supplying heat to the deformable storage medium;

a probe positioning apparatus to position the plurality of heat probes with respect to the storage medium; and

a controller configured to (A) during an erase mode, control the probe positioning apparatus in positioning a given one of the heat probes proximate a first of the one or more indentations, and (B) during the erase mode, cause the given one of the heat probes to heat the storage medium to or near its melting point so that the first indentation in the storage medium is removed and the data is erased.

2. The data storage device of claim 1 in which the storage components are operated in a vacuum.

3. The data storage device of claim 1 in which the storage components are operated in an inert gas.

4. A data storage device for use with a deformable storage medium having stored data in the form of one or more indentations mechanically impressed thereon, the data storage device comprising:

a plurality of heat probes for supplying heat to the deformable storage medium;

a probe positioning apparatus to position the plurality of heat probes with respect to the storage medium; and

a controller configured to (A) during an erase mode, control the probe positioning apparatus in positioning a given one of the heat probes proximate a first of the one or more indentations, and (B) during the erase mode, cause the given one of the heat probes to heat the storage medium to or near its melting point so that the first indentation in the storage medium is removed and the data is erased.

5. The data storage device of claim 4 in which the storage components are operated in a vacuum.

6. The data storage device of claim 4 in which the storage components are operated in an inert gas.

7. A data storage device comprising:

a deformable storage medium;

a plurality of probes each comprising;

a tip comprising a conductive highly obdurate coating capable of deforming the storage medium, and

a tip positioning apparatus to lower the tip;

a plurality of heat probes for supplying heat to the deformable medium; and

a probe and storage medium positioning apparatus to position the probes over the storage medium; and

a controller to (A) during a write mode, control the probe and storage medium positioning apparatus in positioning the probes over the storage medium, (B) during the write mode, control each tip positioning apparatus in lowering the corresponding tip a predetermined amount into the storage medium so as to cause a predetermined amount of mechanical deformation in the storage medium representing data written thereto, (C) during read mode, control the probe and storage medium positioning apparatus in positioning the probes over the storage medium, (D) during the read mode, control each tip positioning apparatus in lowering the corresponding tip close to the storage medium, and (L) during the read mode, produce and measure a tunneling current between the conductive obdurate coating of each tip and the storage medium to identify a predetermined amount of deformation caused in the storage medium below the corresponding tip during the write mode so that the data written thereto is read therefrom, and (F) during an erase mode, control the positioning apparatus in positioning a given one of the heat probes proximate a first of the one or more indentations, and (G) during the erase mode, cause the given one of the heat probes to heat the storage medium to or near its melting point so that the first indentation in the storage medium is removed and the data is erased.

8. The data storage device of claim 7 wherein the plurality of heat probes use the same tips as the plurality of probes.

9. The data storage device of claim 7 wherein the plurality of heat probes use different tips than the plurality of probes.

10. The data storage device of claim 7 in which the storage components are operated in a vacuum.

11. The data storage device of claim 7 in which thestorage components are operated in an inert gas.