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Apparatus and method for the analysis of a process having parameter-based faults

  • US 7,536,371 B2
  • Filed: 12/05/2006
  • Issued: 05/19/2009
  • Est. Priority Date: 12/05/2005
  • Status: Expired due to Fees
First Claim
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1. An apparatus for the analysis of a process having parameter-based faults, comprising:

  • a parameter value inputer configured for inputting values of at least one process parameter;

    a fault detector, configured for detecting the occurrence of a fault;

    a learning file creator associated with said parameter value inputer and said fault detector, configured for separating said input values into a first learning file and a second learning file, said first learning file comprising input values from a collection period preceding each of said detected faults, and said second learning file comprising input values input outside said collection periods; and

    a learning file analyzer associated with said learning file creator, configured for performing a separate statistical analysis of said first and second learning files, thereby to assess a process status.

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