Method for forming and measuring the thickness of an anodized coating
First Claim
1. A method for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate, said method including:
- (a) using an anodizing system having a bath;
(b) placing the substrate into the bath to facilitate the formation of the anodized coating on at least a portion of the substrate thereby creating the anodized substrate; and
(c) measuring the anodized coating with a coating thickness monitor to determine the thickness of at least a portion of the anodized coating on the substrate formed in said bath, said measuring including;
(i) directing at least one radiation source at at least a portion of the anodized substrate;
(ii) capturing with at least one probe at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; and
(iii) transmitting to at least one detector from said at least one probe said captured radiation, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate.
2 Assignments
0 Petitions
Accused Products
Abstract
An anodizing system for forming a anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The anodizing system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.
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Citations
20 Claims
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1. A method for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate, said method including:
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(a) using an anodizing system having a bath; (b) placing the substrate into the bath to facilitate the formation of the anodized coating on at least a portion of the substrate thereby creating the anodized substrate; and (c) measuring the anodized coating with a coating thickness monitor to determine the thickness of at least a portion of the anodized coating on the substrate formed in said bath, said measuring including; (i) directing at least one radiation source at at least a portion of the anodized substrate; (ii) capturing with at least one probe at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; and (iii) transmitting to at least one detector from said at least one probe said captured radiation, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method for measuring using a coating thickness monitor the thickness of at least a portion of an anodized coating on at least a portion of a substrate formed in an anodizing system having a bath into which the substrate is placed to facilitate the formation of the anodized coating on the substrate thereby creating the anodized substrate, said method including:
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(a) providing coating thickness monitor; (b) directing at least one radiation source at at least a portion of the anodized substrate; (c) capturing using at least one probe at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; (d) transmitting the captured radiation using a guide system from said at least one probe to said at least one detector; and (e) processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate. - View Dependent Claims (16, 17, 18)
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19. A method for forming an anodized coating using an anodizing system on at least a portion of a substrate thereby creating an anodized substrate, said method including:
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(a) providing anodizing system; (b) placing the substrate into a bath to facilitate the formation of the anodized coating on at least a portion of on the substrate thereby creating the anodized substrate; (c) measuring using a coating thickness monitor a thickness of at least a portion of the anodized coating on the substrate formed in said bath, said measuring using the coating thickness monitor including; (i) directing at least one radiation source at at least a portion of the anodized substrate; (ii) capturing using at least one probe at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; (iii) transmitting using at least one guide system the captured radiation from said at least one probe to at least one detector; and (iv) processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate; and (d) communicating the determined coating thickness with at least one controller. - View Dependent Claims (20)
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Specification