Automatic test pattern generation tool with feedback path capabilities for testing circuits with repeating blocks
First Claim
1. A computer-implemented method for generating test data for testing an integrated circuit, wherein the integrated circuit has a design that is represented by a circuit netlist containing a plurality of identical netlist modules, and wherein each of the identical netlist modules has inputs and outputs connected to other identical netlist modules, the method comprising:
- using a computer-implemented tool to create a test netlist in storage for a given one of the identical netlist modules by automatically altering a given one of the identical netlist modules so that its outputs are connected to its inputs and form feedback paths; and
using an automatic test pattern generation tool to process the test netlist to generate the test data in a computer-readable storage medium for testing the integrated circuit.
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Accused Products
Abstract
Methods and apparatus for testing integrated circuits are provided. Integrated circuits sometimes contain repeating blocks of identical circuitry. Each identical circuit block contains scan chain registers that can be used to support testing. Each circuit block also has associated inputs and outputs. The inputs and outputs of the circuit blocks serve to interconnect each block to its neighboring blocks. An integrated circuit to be tested is described by a circuit netlist. The circuit netlist is processed to identify identical netlist modules. The repeating netlist modules correspond to the identical circuit blocks on the integrated circuit. By processing a given instance of a repeating netlist module, block-level test data can be generated. Global test data suitable for testing the entire integrated circuit can be generated from the block-level test data.
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Citations
13 Claims
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1. A computer-implemented method for generating test data for testing an integrated circuit, wherein the integrated circuit has a design that is represented by a circuit netlist containing a plurality of identical netlist modules, and wherein each of the identical netlist modules has inputs and outputs connected to other identical netlist modules, the method comprising:
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using a computer-implemented tool to create a test netlist in storage for a given one of the identical netlist modules by automatically altering a given one of the identical netlist modules so that its outputs are connected to its inputs and form feedback paths; and using an automatic test pattern generation tool to process the test netlist to generate the test data in a computer-readable storage medium for testing the integrated circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 9)
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8. A computer-implemented method for generating test data for testing an integrated circuit, wherein the integrated circuit has a design that is represented by a circuit netlist containing a plurality of identical netlist modules, and wherein each of the identical netlist modules has inputs and outputs connected to other identical netlist modules, the method comprising:
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using a computer-implemented tool to create a test netlist for a given one of the identical netlist modules by automatically altering a given one of the identical netlist modules so that its outputs are connected to its inputs and form feedback paths; using an automatic test pattern generation tool to process the test netlist to generate the test data for testing the integrated circuit; and using a tester to apply the test data to scan chain registers in the integrated circuit.
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10. Software on a computer-readable storage media used for generating test data for testing an integrated circuit, wherein the integrated circuit has a design that is represented by a circuit netlist containing a plurality of identical netlist modules, and wherein each of the identical netlist modules has inputs and outputs connected to other identical netlist modules, comprising:
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code for creating a test netlist in storage from a given one of the identical netlist modules by automatically altering that given one of the identical netlist modules so that its outputs are connected to its inputs and form feedback paths; and code for processing the test netlist using an automatic test pattern generation tool to generate the test data in a computer-readable storage medium for testing the integrated circuit. - View Dependent Claims (11, 12, 13)
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Specification