Process condition measuring device with shielding
First Claim
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1. A process condition measuring device for measuring a process condition in a processing system that processes workpieces of standard dimensions, comprising:
- a first conductive substrate portion;
a second conductive substrate portion;
an electrical circuit interposed between the first conductive substrate portion and the second conductive substrate portion; and
the first and second conductive substrate portions electrically connected together to form an electrically continuous body that has at least one dimension that is equal to a dimension of a workpiece processed by the processing system.
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Accused Products
Abstract
A process condition measuring device has electronic components sandwiched between two conductive substrate portions. The conductive substrate portions are joined by an electrically conductive pathway. Native oxide is removed from substrate portions and electrically conductive contact pads are formed that are then joined together with electrically conductive adhesive to form the electrically conductive pathway.
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Citations
11 Claims
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1. A process condition measuring device for measuring a process condition in a processing system that processes workpieces of standard dimensions, comprising:
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a first conductive substrate portion; a second conductive substrate portion; an electrical circuit interposed between the first conductive substrate portion and the second conductive substrate portion; and the first and second conductive substrate portions electrically connected together to form an electrically continuous body that has at least one dimension that is equal to a dimension of a workpiece processed by the processing system. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of forming a process condition measuring device for measuring a process condition in a processing system that processes workpieces of standard dimensions, the process condition measuring device having protection against electromagnetic fields, the method comprising:
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forming a first substrate portion of a conductive material; forming a first contact pad on the first substrate portion, the first contact pad in direct electrical contact with the first substrate portion; forming a second substrate portion of the conductive material; forming a second contact pad on the second substrate portion , the second contact pad in direct electrical contact with the second substrate portion; placing an electronic circuit between the first substrate portion and the second substrate portion; and connecting the first substrate portion and the second substrate portion together, with the electronic circuit between them, such that the first contact pad is electrically connected to the second contact pad, wherein the first and second conductive substrate portions together form an electrically continuous body that has at least one dimension that is equal to a dimension of a workpiece processed by the processing system. - View Dependent Claims (8, 9, 10, 11)
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Specification