Condition-analyzing device
First Claim
1. A condition analysis apparatus comprising:
- a three-dimensional sensor for measuring, at a plurality of sampling points, sampling-point-moves in a height direction of an object existing in a target area; and
area definition means for defining an area where a plurality of the sampling-point-moves are in generally a same phase, wherein the area definition means searches a specific area for sampling points representing the sampling-point-moves in the same specific type of phase, forms a group of the sampling points representing the sampling-point-moves in generally the same phase based on search results of the searching, and defines the formed group of sampling points as an area where the sampling-point-moves in generally the same phase are occurring;
said three-dimensional sensor comprising;
a projection device for projecting a light pattern on the target area;
an image capturing apparatus for capturing an image of the target area while the light pattern is projected thereon, said image capturing apparatus being installed distanced from said projection device; and
measurement means for measuring shifts of the pattern on the captured images,wherein sampling-point-moves in the height direction of the object are measured at the plurality of points based on the shifts of the pattern measured.
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Accused Products
Abstract
A condition analysis apparatus capable of grasping the condition of an object easily and accurately is provided. The condition analysis apparatus 1 includes a three-dimensional sensor 10 for measuring sampling-point-moves in the height direction of an object 2 existing in a target area at a plurality of sampling points, and area definition means 22 for defining an area where a plurality of the sampling-point-moves are in the generally same phase. The thus constructed condition analysis apparatus 1 can grasp the condition of the object 2 easily and accurately. Preferably, the condition analysis apparatus 1 includes information output means 40 for outputting information of an area including the area defined by the area definition means 22.
17 Citations
8 Claims
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1. A condition analysis apparatus comprising:
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a three-dimensional sensor for measuring, at a plurality of sampling points, sampling-point-moves in a height direction of an object existing in a target area; and area definition means for defining an area where a plurality of the sampling-point-moves are in generally a same phase, wherein the area definition means searches a specific area for sampling points representing the sampling-point-moves in the same specific type of phase, forms a group of the sampling points representing the sampling-point-moves in generally the same phase based on search results of the searching, and defines the formed group of sampling points as an area where the sampling-point-moves in generally the same phase are occurring; said three-dimensional sensor comprising; a projection device for projecting a light pattern on the target area; an image capturing apparatus for capturing an image of the target area while the light pattern is projected thereon, said image capturing apparatus being installed distanced from said projection device; and measurement means for measuring shifts of the pattern on the captured images, wherein sampling-point-moves in the height direction of the object are measured at the plurality of points based on the shifts of the pattern measured. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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Specification