×

Condition-analyzing device

  • US 7,545,279 B2
  • Filed: 06/03/2004
  • Issued: 06/09/2009
  • Est. Priority Date: 06/09/2003
  • Status: Active Grant
First Claim
Patent Images

1. A condition analysis apparatus comprising:

  • a three-dimensional sensor for measuring, at a plurality of sampling points, sampling-point-moves in a height direction of an object existing in a target area; and

    area definition means for defining an area where a plurality of the sampling-point-moves are in generally a same phase, wherein the area definition means searches a specific area for sampling points representing the sampling-point-moves in the same specific type of phase, forms a group of the sampling points representing the sampling-point-moves in generally the same phase based on search results of the searching, and defines the formed group of sampling points as an area where the sampling-point-moves in generally the same phase are occurring;

    said three-dimensional sensor comprising;

    a projection device for projecting a light pattern on the target area;

    an image capturing apparatus for capturing an image of the target area while the light pattern is projected thereon, said image capturing apparatus being installed distanced from said projection device; and

    measurement means for measuring shifts of the pattern on the captured images,wherein sampling-point-moves in the height direction of the object are measured at the plurality of points based on the shifts of the pattern measured.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×