Image sensor device having improved noise suppression capability and a method for supressing noise in an image sensor device
First Claim
1. An image sensor device comprising:
- an uncovered imaging array having M rows and N columns of pixels;
a covered global reference non-imaging array comprising at least one global reference row, as at least one dark row of non-imaging pixels;
imaging array sampling logic configured to sample each of the M rows of pixels of the uncovered imaging array to obtain M sets of image pixel sample values, each of the M sets of image pixel samples having N image pixel sample values;
global reference non-imaging array sampling logic configured to sample one dark row of said covered global reference row non-imaging array to obtain a set of reference pixel sample values, and wherein said one dark row is sampled simultaneously with the sampling of each respective row of the M rows of the uncovered imaging array such that M sets of the reference pixel sample values from the one dark row are obtained;
averaging circuitry configured to average each of the M sets of the reference pixel sample values to obtain M average values each associated with a respective set of the image pixel sample values of the M sets; and
imaging array sample selection circuitry configured to select the N image pixel sample values of a respective set of the M sets of image pixel sample values from the uncovered imaging array;
difference circuitry, for each of the M sets of image pixel sample values of the uncovered imaging array, configured to receive the selected set of image pixel sample values and the average value associated with the selected set of image pixel sample values of the uncovered imaging array from the averaging circuitry,wherein the difference circuitry is further configured to subtract the average value associated with the selected set of image pixel sample values from each of the N image pixel sample values of the selected set to obtain M sets of N output image sample values.
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Abstract
An image sensor device is provided that has an uncovered imaging array of pixels and a covered global reference non-imaging array of pixels. The pixel samples of the global reference non-imaging array are used to remove noise from the pixel samples of the imaging array. The control signals and control lines that are used to sample the pixels of the imaging array are separate from and independent of the control signals and control lines that are used to sample the pixels of the global reference non-imaging array of pixels. For each row of pixels of the imaging array that is sampled, the same row of pixels of the global reference non-imaging array is sampled. The global reference row has no or very few offsets or variations to ensure that noise removal is performed effectively.
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Citations
23 Claims
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1. An image sensor device comprising:
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an uncovered imaging array having M rows and N columns of pixels; a covered global reference non-imaging array comprising at least one global reference row, as at least one dark row of non-imaging pixels; imaging array sampling logic configured to sample each of the M rows of pixels of the uncovered imaging array to obtain M sets of image pixel sample values, each of the M sets of image pixel samples having N image pixel sample values; global reference non-imaging array sampling logic configured to sample one dark row of said covered global reference row non-imaging array to obtain a set of reference pixel sample values, and wherein said one dark row is sampled simultaneously with the sampling of each respective row of the M rows of the uncovered imaging array such that M sets of the reference pixel sample values from the one dark row are obtained; averaging circuitry configured to average each of the M sets of the reference pixel sample values to obtain M average values each associated with a respective set of the image pixel sample values of the M sets; and imaging array sample selection circuitry configured to select the N image pixel sample values of a respective set of the M sets of image pixel sample values from the uncovered imaging array; difference circuitry, for each of the M sets of image pixel sample values of the uncovered imaging array, configured to receive the selected set of image pixel sample values and the average value associated with the selected set of image pixel sample values of the uncovered imaging array from the averaging circuitry, wherein the difference circuitry is further configured to subtract the average value associated with the selected set of image pixel sample values from each of the N image pixel sample values of the selected set to obtain M sets of N output image sample values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An image sensor device comprising:
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an uncovered imaging array having M rows and N columns of pixels, the imaging array having a parasitic capacitance; an uncovered non-imaging array having M rows and P columns of non-imaging pixels, the uncovered non-imaging array having a second parasitic capacitance that at least approximately matches the parasitic capacitance of the imaging array; and a covered global reference non-imaging array comprising at least one dark row of non-imaging pixels coupled to the uncovered non-imaging array such that the parasitic capacitance experienced by a imaging pixel and by a non-imaging pixel sampled simultaneously are approximately the same capacitance. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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18. A method for suppressing noise in an image sensor device, the method comprising:
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sampling rows of pixels of an imaging array of the image sensor device to obtain an image pixel sample value for each pixel of the imaging array, the image pixel sample values for each row of pixels comprising respective sets of image pixel sample values; concurrently with the sampling of each row of pixels of the imaging array, sampling a covered global reference row of non-imaging pixels of the image sensor device to obtain a dark reference pixel sample value for each pixel of the covered global reference row, the dark reference pixel sample values obtained for each sampling of the covered global reference row comprising respective sets of dark reference pixel sample values; averaging each set of dark reference sample values to obtain a respective average dark reference sample value for each respective set of dark reference pixel sample values; and subtracting the respective average dark reference sample value associated with a set of image pixel sample values from a respective row of the imaging array from each image pixel sample value of the set of image pixel sample values for each row of the imaging array sampled to obtain respective sets of final image sample values. - View Dependent Claims (19, 20, 21, 22)
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23. An image sensor device comprising:
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an imaging array having a plurality pixels in rows and columns; a non-imaging reference array including a plurality of pixels in at least one dark row; a first sampling logic configured to sample a set of pixel values from each respective row of the imaging array; a second sampling logic, separate for the first sampling logic, and configured to sample pixel values of one dark row of the non-imaging array such that each row of the imaging array is sampled simultaneously with the sampling of the one dark row of the non-imaging array to generate a composite correction value for each respective row of the imaging array; and processing circuitry configured to receive each set of pixel values from each respective row of the imaging array and to subtract the generated composite correction value associated with a respective row of the imaging array from each pixel value of a corresponding set of pixel values from the imaging array for each set of pixel values.
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Specification