Method and apparatus for measuring the force of stiction of a membrane in a MEMS device

• US 7,545,556 B2
• Filed: 12/21/2006
• Issued: 06/09/2009
• Est. Priority Date: 12/21/2006
• Status: Expired due to Fees

• Current Assignee: Snaptrack Incorporated (Qualcomm, Inc.)
• Original Assignee: Qualcomm MEMS Technologies Incorporated (Qualcomm, Inc.)
• Inventors: Khazeni, Kasra
• Primary Examiner(s): Stultz; Jessica T
• Assistant Examiner(s): Sahle; Mahidere S
• Application Number:
  US11/614,795
• Publication Number:
  US 20080150517A1
• Time in Patent Office: 901 Days
• Field of Search: 359/290, 359/291
• US Class Current: 359/291
• CPC Class Codes: G02B 26/001 based on interference in an adjustable optical cavity interference filters G02B5/28; devices or arrangements using multiple reflections in spectrometry or monochromators G01J3/26

Abstract

Disclosed are methods and systems for testing MEMS devices (e.g., interferometric modulators) so as to induce a moveable element to move from a first position to a second position and to detect the movement. The methods include applying an electrical current to the movable element in the presence of a magnetic field, thereby producing a Lorentz force on the movable element. The force required to move the movable element from the first position to the second position can then be estimated based on the magnitudes and geometric relationships of the electrical current and the magnetic field, and the geometry of the movable element. In some embodiments, the first position may be a movable element adhered to another surface (e.g., a layer on a substrate) due to stiction forces. In these embodiments, the stiction forces can be estimated. In other embodiments, the first position may be a relaxed position, where the movable element is spaced a first distance from a substrate, and the second position may be a second distance from the substrate and/or contacting the substrate. In these embodiments, the springiness (e.g., a spring constant) of support structures supporting the movable element can be estimated.

Claims

1. A method of testing an array of interferometric modulators, comprising:

applying an electrical current to an electrode connected to an movable reflective element of an array of interferometric modulators, the array comprising a plurality of interferometric modulators comprising one or more movable reflective elements, the movable reflective elements coupled to a substrate and contacting a surface in an actuated state, wherein at least one of the movable reflective elements is adhered to the surface in the actuated state;

applying a magnetic field to the array;

detecting movement of the movable reflective element, and

estimating a force required to move the movable reflective element based on a strength of the applied electrical current and a strength of the applied magnetic field.

2. The method of claim 1, the movable reflective elements being spaced apart from the substrate in a relaxed state.

3. The method of claim 1, the movable reflective elements being proximate to or in contact with the substrate in a relaxed state.

4. The method of claim 1, wherein applying the electrical current comprises applying an electrical current waveform.

5. The method of claim 1, wherein applying the magnetic field comprises applying a magnetic field waveform.

6. The method of claim 1, wherein at least a portion of the magnetic field is perpendicular to the current in the electrode.

7. The method of claim 1, further comprising:

applying the electrical current by applying an electrical current waveform comprising a plurality of pulses of different amplitudes until the movable reflective element moves from the actuated state.

8. The method of claim 7, further comprising:

recording the amplitude of the electrical pulse applied upon detecting movement.

9. The method of claim 7, further comprising:

increasing the strength of the applied magnetic field if a maximum allowable electrical pulse does not result in movement of the movable reflective element; and

continuing to apply the plurality of pulses of different amplitudes until the movable reflective element moves.

10. The method of claim 1, wherein detecting movement of the movable reflective element comprises measuring light reflected from the interferometric modulator containing the movable reflective element.

11. The method of claim 10, wherein measuring the light comprises using a photodetector.

12. The method of claim 1, further comprising:

applying the electrical current to a common electrode connected to a plurality of movable reflective elements, wherein one or more of the movable reflective elements of the common electrode are adhered in the actuated state; and

detecting movement of any of the adhered movable reflective elements of the common electrode.

13. The method of claim 1, wherein the magnetic field is substantially perpendicular to the current applied to the electrode and substantially perpendicular to a direction of motion of the movable reflective element.

39. The method of claim 1, wherein the detected movement of the movable reflective element is movement from an actuated state to a non-actuated state.

40. The method of claim 1, further comprising estimating a force of stiction based on the estimated force required to move the conductive movable element.

41. The method of claim 1, wherein the strength of the applied electrical current and the strength of the applied magnetic field are as of when the movement is detected.

14. A method of testing a microelectromechanical system (MEMS) device, comprising:

applying an electrical current to a conductive movable element of the MEMS device;

applying a magnetic field to the conductive movable element;

detecting movement of the conductive movable element and

estimating a force required to move the conductive movable reflective element based on a strength of the applied electrical current and a strength of the applied magnetic field.

15. The method of claim 14, wherein applying the electrical current comprises applying an electrical current waveform.

16. The method of claim 14, wherein applying the magnetic field comprises applying a magnetic field waveform.

17. The method of claim 14, wherein at least a portion of the magnetic field is perpendicular to the applied electrical current.

18. The method of claim 14, wherein the conductive movable element is formed over a substrate and separated from the substrate by a first distance in a first state, and configured to be movable to be separated from the substrate by a second distance in a second state, the method further comprising:

applying the electrical current and the magnetic field when the movable element is in the first state thereby causing the movable element to move to the second state.

19. The method of claim 18, wherein the first state comprises the movable element being adhered to another structure and the second state comprises the conductive movable element being separated from the other structure.

20. The method of claim 19, further comprising:

applying the electrical current by applying an electrical current waveform comprising a plurality of pulses of different amplitudes until the conductive movable element moves from the first state; and

recording the amplitude of the electrical pulse applied upon detecting movement.

21. The method of claim 20, further comprising:

increasing the strength of the applied magnetic field if a maximum allowable electrical pulse does not result in movement of the conductive movable element from the first state; and

continuing to apply a plurality of pulses of different amplitudes until the conductive movable element moves from the first state.

22. The method of claim 14, wherein detecting movement of the movable element comprises using a photodetector.

23. The method of claim 22, further comprising determining a displacement of the moveable element upon detecting movement.

42. The method of claim 14, wherein the detected movement of the conductive movable element is movement from a first state to a second state.

24. A system for testing an array of interferometric modulators, comprising:

a power source configured to apply an electrical current to an electrode connected to an movable reflective element of an array of interferometric modulators, the array comprising a plurality of interferometric modulators comprising one or more movable reflective elements, the movable reflective elements coupled to a substrate and contacting a surface in an actuated state, wherein at least one of the movable reflective elements is adhered to the surface in the actuated state;

a magnetic field generator configured to apply a magnetic field to the array;

an optical detector configured to detect light reflected from the array and produce a signal corresponding to the detected light; and

a computer configured to receive the signal from the optical detector and determine movement of the movable reflective element,

wherein the computer is further configured to estimate a force required to move the movable reflective element based on a strength of the applied electrical current and a strength of the applied magnetic field.

25. The method of claim 24, the movable reflective elements being spaced apart from the substrate in a relaxed state.

26. The method of claim 24, the movable reflective elements being proximate to or in contact with the substrate in a relaxed state.

27. The system of claim 24, wherein at least a portion of the magnetic field is perpendicular to the current in the electrode.

28. The system of claim 24, wherein the computer is coupled to the power source and configured to cause the power source to apply an electrical current waveform.

29. The system of claim 28, wherein the computer is further configured to cause the power source to apply an electrical current waveform comprising a plurality of pulses of different amplitudes until the movable reflective element moves from the actuated state.

30. The system of claim 29, wherein the computer is further configured to receive a signal indicating the amplitude of the electrical pulse applied when movement was determined.

31. The system of claim 24, further comprising an illumination source configured to illuminate the array.

32. A system for testing a microelectromechanical system (MEMS) device, comprising:

a power source configured to apply an electrical current to a conductive movable element of the MEMS device;

a magnetic field generator configured to apply a magnetic field to the conductive movable element;

an optical system configured to detect movement of the movable element, and

a computer configured to estimate a force required to move the movable element based on a strength of the applied electrical current and a strength of the applied magnetic field.

33. The system of claim 32, wherein the computer is coupled to the power source and is further configured to cause the power source to apply an electrical current waveform.

34. The system of claim 32, wherein at least a portion of the magnetic field is perpendicular to the applied electrical current.

35. A system for testing a microelectromechanical system (MEMS) device, wherein the MEMS device comprises at least one conductive movable element, the method comprising:

means for applying an electrical current to the conductive movable element;

means for applying a magnetic field to the conductive movable element;

means for detecting a movement of the movable element, and

means for estimating a force required to move the conductive movable element based on a strength of the applied electrical current and a strength of the applied magnetic field.

36. The system of claim 35, wherein the means for applying the electrical current comprises a power source.

37. The system of claim 35, wherein the means for applying the magnetic field comprises a magnetic field generator.

38. The system of claim 35, wherein the detecting means comprises an optical detector.