Nonplanar device with thinned lower body portion and method of fabrication
First Claim
1. A method of forming a device comprising:
- forming a semiconductor body on an insulating layer of a substrate, said semiconductor body having a top surface opposite a bottom surface formed on said insulating layer and a pair of laterally opposite sidewalls wherein the laterally opposite sidewalls include a tapered portion such that the distance between said laterally opposite sidewalls is less at the bottom surface of said semiconductor body than at the top surface of said semiconductor body;
forming a gate dielectric layer on and in direct contact with said top surface of said semiconductor body and on said sidewalls of said semiconductor body, wherein the composition of said gate dielectric layer formed on said top surface is the same composition as said gate dielectric layer on said sidewalls;
forming a gate electrode on said gate dielectric layer on said top surface of said semiconductor body and adjacent to said gate dielectric layer on said sidewalls of said semiconductor body; and
forming a pair of source/drain regions in said semiconductor body on opposite sides of said gate electrode.
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Abstract
A nonplanar semiconductor device having a semiconductor body formed on an insulating layer of a substrate. The semiconductor body has a top surface opposite a bottom surface formed on the insulating layer and a pair of laterally opposite sidewalls wherein the distance between the laterally opposite sidewalls at the top surface is greater than at the bottom surface. A gate dielectric layer is formed on the top surface of the semiconductor body and on the sidewalls of the semiconductor body. A gate electrode is formed on the gate dielectric layer on the top surface and sidewalls of the semiconductor body. A pair of source/drain regions are formed in the semiconductor body on opposite sides of the gate electrode.
285 Citations
15 Claims
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1. A method of forming a device comprising:
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forming a semiconductor body on an insulating layer of a substrate, said semiconductor body having a top surface opposite a bottom surface formed on said insulating layer and a pair of laterally opposite sidewalls wherein the laterally opposite sidewalls include a tapered portion such that the distance between said laterally opposite sidewalls is less at the bottom surface of said semiconductor body than at the top surface of said semiconductor body; forming a gate dielectric layer on and in direct contact with said top surface of said semiconductor body and on said sidewalls of said semiconductor body, wherein the composition of said gate dielectric layer formed on said top surface is the same composition as said gate dielectric layer on said sidewalls; forming a gate electrode on said gate dielectric layer on said top surface of said semiconductor body and adjacent to said gate dielectric layer on said sidewalls of said semiconductor body; and forming a pair of source/drain regions in said semiconductor body on opposite sides of said gate electrode. - View Dependent Claims (2, 3, 4)
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5. A method of forming a transistor comprising:
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providing a substrate having an oxide insulating layer formed thereon and a semiconductor thin film formed on the oxide insulating layer; etching said semiconductor film to form a semiconductor body having a top surface opposite a bottom surface on said oxide insulating film and a pair of laterally opposite sidewalls; etching said semiconductor body to reduce the distance between laterally opposite sidewalls near the bottom of said semiconductor body relative to the top of said semiconductor body; forming a gate dielectric layer on and in direct contact with the top surface and sidewalls of said semiconductor body, wherein the composition of said gate dielectric layer formed on said top surface is the same composition as said gate dielectric layer on said sidewalls; forming a gate electrode on said gate dielectric layer on the top of said semiconductor body and adjacent to the gate dielectric layer on the sidewalls of said semiconductor body; and forming a pair of source/drain regions in said semiconductor body on opposite sides of said gate electrode. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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Specification