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X-ray inspection based on scatter detection

  • US 7,551,715 B2
  • Filed: 10/23/2006
  • Issued: 06/23/2009
  • Est. Priority Date: 10/24/2005
  • Status: Active Grant
First Claim
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1. An inspection system for inspecting an object, the system comprising:

  • a source of penetrating radiation, disposed with respect to the object such that the inspected field of view is less than 0.1 steradians;

    a spatial modulator for forming the penetrating radiation into a beam for irradiating an object with a scanning profile;

    a detector for detecting scattered radiation from the object, separated from the source of penetrating radiation, and disposed, with respect to the object, such as to subtend greater than 0.5 steradians in a field of view of the object.

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