X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
First Claim
Patent Images
1. A system for inspecting an object, the system comprising:
- a. a first radiation source that emits a fan beam of penetrating radiation;
b. a segmented array of detector elements for measuring the intensity of penetrating radiation transmitted through the object by the first radiation source;
c. a second radiation source that emits a scanning pencil beam of penetrating radiation;
d. at least one scatter detector for detecting penetrating radiation scattered out of the scanning pencil beam by the object; and
e. a processor, a memory, and a display, the memory containing instructions that cause the processor;
to subtract a background signal from a measured signal from the scatter detector, the background signal measured by the scatter detector when the scanning pencil beam is not illuminating the object, thereby forming a corrected measured scatter signal, andto display on the display the corrected measured scatter signal and a measured transmission signal from the segmented array of detector elements for use in inspecting the object.
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Abstract
An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.
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Citations
16 Claims
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1. A system for inspecting an object, the system comprising:
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a. a first radiation source that emits a fan beam of penetrating radiation; b. a segmented array of detector elements for measuring the intensity of penetrating radiation transmitted through the object by the first radiation source; c. a second radiation source that emits a scanning pencil beam of penetrating radiation; d. at least one scatter detector for detecting penetrating radiation scattered out of the scanning pencil beam by the object; and e. a processor, a memory, and a display, the memory containing instructions that cause the processor; to subtract a background signal from a measured signal from the scatter detector, the background signal measured by the scatter detector when the scanning pencil beam is not illuminating the object, thereby forming a corrected measured scatter signal, and to display on the display the corrected measured scatter signal and a measured transmission signal from the segmented array of detector elements for use in inspecting the object. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A system for inspecting an object, the system comprising:
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a. a first radiation source that emits a fan beam of penetrating radiation; b. a segmented array of detector elements for measuring the intensity of penetrating radiation transmitted through the object from the first radiation source, the array including a collimator to intercept radiation scattered by the array; c. a second radiation source that emits a scanning pencil beam of penetrating radiation; d. at least one scatter detector for detecting penetrating radiation scattered out of the scanning pencil beam by the object, the scatter detector further including means for intercepting radiation scattered from the fan beam; and e. a processor, a memory and a display, the memory containing instructions that cause the processor; to subtract a background signal from a measured signal from the scatter detector, the background signal measured by the scatter detector when the second radiation source is not illuminating the object, thereby forming a corrected measured scatter signal, and to display on the display the corrected measured scatter signal and a measured transmission signal from the segmented array of detector elements for use in inspecting the object. - View Dependent Claims (15, 16)
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Specification