Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems
First Claim
Patent Images
1. An integrated circuit chip, comprising:
- a semiconductor substrate;
an alpha particle emitter supported by the substrate;
an alpha particle detector supported by the substrate; and
wherein the alpha particle emitter comprises one or both of radium and americium.
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Abstract
Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor substrate. Some embodiments include an apparatus for obtaining backscatter data from a sample utilizing an alpha particle emission and detection system supported by a semiconductor substrate. Some embodiments include methods of backscatter analysis utilizing a semiconductor substrate containing an alpha particle emitter and an alpha particle sensor.
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Citations
32 Claims
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1. An integrated circuit chip, comprising:
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a semiconductor substrate; an alpha particle emitter supported by the substrate; an alpha particle detector supported by the substrate; and wherein the alpha particle emitter comprises one or both of radium and americium.
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2. An integrated circuit chip, comprising:
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a semiconductor substrate; an alpha particle emitter supported by the substrate; an alpha particle detector supported by the substrate; and a magnetic lens supported by the substrate and configured for focusing alpha particles emitted from the emitter.
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3. An integrated circuit chip, comprising:
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a semiconductor substrate; an alpha particle emitter supported by the substrate; an alpha particle detector supported by the substrate; and shielding between the alpha particle emitter and the alpha particle detector. - View Dependent Claims (4, 5, 6, 7, 8, 9, 10, 11)
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12. An apparatus for obtaining backscatter data from a sample, comprising:
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an alpha particle emission and detection system configured to obtain backscatter data from the sample, the alpha particle emission and detection system comprising an integrated circuit chip that includes a semiconductor substrate supporting an alpha particle emitter and an alpha particle detector;
the integrated circuit chip having a projection associated therewith;
the projection being configured to be against a surface of the sample or a surface proximate the sample, and to space the alpha particle detector and emitter over the sample to leave a gap between the sample and a portion of the integrated circuit chip over the sample; anda vacuum system configured to reduce a pressure within the gap to less than atmospheric pressure. - View Dependent Claims (13, 14, 15, 16)
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17. A method of forming an alpha particle emission and detection system, comprising:
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forming shielding material over a semiconductor substrate, the shielding material having a receptacle therein; forming alpha particle emitter material within the receptacle; and forming at least one alpha particle sensor over the semiconductor substrate, the shielding material being between the at least one sensor and the emitter material. - View Dependent Claims (18, 19, 20, 21, 22, 23)
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24. A method of backscatter analysis, comprising:
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placing a sample proximate an alpha particle emission and detection system, the alpha particle emission and detection system comprising at least one integrated circuit chip that includes a semiconductor substrate supporting an alpha particle emitter and an alpha particle sensor; emitting alpha particles from the alpha particle emitter toward the sample, some of the alpha particles being backscattered by the sample; detecting the backscattered alpha particles with the alpha particle sensor; transferring information regarding the backscattered particles from the sensor to a processor; and processing the information with the processor. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32)
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Specification