Method of expanding tester drive and measurement capability
First Claim
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1. A probe card assembly comprising:
- an interface configured to receive from a tester test signals for testing an electronic device;
probes for contacting a plurality of electronic devices;
transmission lines having a characteristic impedance and being electrically connected to the probes; and
electronic driver circuits connected to the interface and each configured to drive one of the test signals through a plurality of the probes via the transmission lines, wherein the one test signal can be provided to more than one of the electronic devices, and wherein an output impedance of each of the driver circuits is less than the characteristic impedance of the transmission lines.
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Abstract
A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones of the probes.
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Citations
18 Claims
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1. A probe card assembly comprising:
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an interface configured to receive from a tester test signals for testing an electronic device; probes for contacting a plurality of electronic devices; transmission lines having a characteristic impedance and being electrically connected to the probes; and electronic driver circuits connected to the interface and each configured to drive one of the test signals through a plurality of the probes via the transmission lines, wherein the one test signal can be provided to more than one of the electronic devices, and wherein an output impedance of each of the driver circuits is less than the characteristic impedance of the transmission lines. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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Specification