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Method of expanding tester drive and measurement capability

  • US 7,557,592 B2
  • Filed: 06/06/2006
  • Issued: 07/07/2009
  • Est. Priority Date: 06/06/2006
  • Status: Expired due to Fees
First Claim
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1. A probe card assembly comprising:

  • an interface configured to receive from a tester test signals for testing an electronic device;

    probes for contacting a plurality of electronic devices;

    transmission lines having a characteristic impedance and being electrically connected to the probes; and

    electronic driver circuits connected to the interface and each configured to drive one of the test signals through a plurality of the probes via the transmission lines, wherein the one test signal can be provided to more than one of the electronic devices, and wherein an output impedance of each of the driver circuits is less than the characteristic impedance of the transmission lines.

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