Exposure apparatus, device manufacturing method, maintenance method, and exposure method
First Claim
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1. An exposure apparatus which exposes a substrate by irradiating exposure light onto the substrate via a projection optical system and a liquid, comprising:
- a liquid supply system that supplies the liquid; and
a measuring device which measures a time during which the supply of the liquid from the liquid supply system is stopped.
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Accused Products
Abstract
An exposure apparatus can prevent disadvantages of supplying liquid of reduced cleanliness and formation of watermarks. The exposure apparatus (EX) exposes a substrate (P) by irradiating exposure light (EL) onto the substrate (P) via a projection optical system (PL) and a liquid (LQ), and includes a liquid supply mechanism (10) for supplying the liquid (LQ), and a measuring device (60) which measures a time during which the supply of the liquid from the liquid supply mechanism is stopped (10).
36 Citations
18 Claims
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1. An exposure apparatus which exposes a substrate by irradiating exposure light onto the substrate via a projection optical system and a liquid, comprising:
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a liquid supply system that supplies the liquid; and a measuring device which measures a time during which the supply of the liquid from the liquid supply system is stopped. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A maintenance method of a projection optical system which projects an image of a pattern via a liquid, comprising:
measuring an elapsed time from when an end face on an image surface side of the projection optical system becomes in an immersed state to when the end face becomes a non-immersed state. - View Dependent Claims (17, 18)
Specification