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Systems and methods for phase measurements

  • US 7,557,929 B2
  • Filed: 06/18/2004
  • Issued: 07/07/2009
  • Est. Priority Date: 12/18/2001
  • Status: Active Grant
First Claim
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1. A system for measuring phase of light passing through a portion of a sample, comprising:

  • a first light source that generates a first signal at a first wavelength;

    an interferometer that receives the first signal and generates a second signal including a first pulse and a second pulse separated by a time delay to form a pulse pair;

    a first optical path that optically couples the pulse pair from the interferometer with the sample and a second optical path that optically couples the pulse pair from the interferometer with a reference; and

    a detector system that measures a first heterodyne signal from a reflected light pulse pair from the sample and a reflected light pulse pair from the reference resulting from interference between the reflected light from the sample and reflected light from the reference, a phase of the first heterodyne signal indicative of a phase of light from the sample relative to a phase of light from the reference.

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