Apparatus and method for eddy-current scanning of a surface to detect cracks and other defects

• US 7,560,920 B1
• Filed: 10/28/2006
• Issued: 07/14/2009
• Est. Priority Date: 10/28/2005
• Status: Active Grant

• Current Assignee: Innovative Materials Testing Technologies, Inc.
• Original Assignee: Innovative Materials Testing Technologies, Inc.
• Inventors: Sun, Yushi, Ouyang, Tianhe
• Primary Examiner(s): WHITTINGTON, KENNETH
• Application Number:
  US11/553,996
• Time in Patent Office: 990 Days
• Field of Search: 324/202, 324/222, 324/225, 324/228, 324/229, 324/233, 324/239, 324/240, 324/242, 324/243
• US Class Current: 324/242
• CPC Class Codes: G01N 27/902 by moving the sensors
• CPC Class Codes: G01R 33/028 Electrodynamic magnetometers
• CPC Class Codes: G01R 33/04 using the flux-gate principle
• CPC Class Codes: G01R 33/10 Plotting field distribution ; Measuring field distribution

Abstract

An apparatus having a plurality of coils (e.g., numerous thin-film coils formed in an array on a flex circuit), each coil acting as an excitation unit that generates an alternating excitation magnetic signal; and as a sensor configured to detect an eddy-current signal'"'"'s phase and amplitude changes relative to the excitation magnetic signal. In some embodiments, the apparatus electronically scans a surface (e.g., of a metal plate) by successively switching to individual ones of the plurality of excitation/sensing coils (using, e.g., an analog multiplexer) without physical movement in order to detect anomalous signal changes in a manner that reduces signal changes due to probe lift-off relative to the surface. In some embodiments, the coils are placed across a large area of interest, for inspection of a large surface area in a few seconds without moving the apparatus. This can provide high-sensitivity detection and an accurate indication of flaw locations.

Claims

1. An apparatus comprising:

a sensor unit having a plurality of electromagnetic sensing coils;

an excitation/sensing circuit that generates an AC excitation signal, wherein the excitation/sensing circuit includes a differential amplifier;

a plurality of reference coils including a first reference coil and a second reference coil, wherein the first reference coil is configured for a first type of metal and the second reference coil is configured for a second type of metal different from the first type;

a first circuit that includes a multiplexer that at some first period of time electrically connects a first sensing coil selected from the plurality of sensing coils to a first input of the differential amplifier and through a predetermined impedance to the AC excitation signal; and

a second circuit that at the first period of time selectively connects one of the plurality of reference coils to a second input of the differential amplifier, wherein the excitation/sensing circuit is configured to demodulate a first signal from the first sensing coil and the first reference coil in order to detect a phase change, an amplitude change, or both phase and amplitude changes due to a magnetic anomaly of an object being scanned.

2. The apparatus of claim 1,

wherein at some second period of time the second reference coil selected from the plurality of reference coils is selectively connected to the second input of the differential amplifier.

3. The apparatus of claim 1, further comprising:

a first calibration coil located adjacent to a calibration piece of material similar in construction to the object being scanned, wherein the multiplexer is configured to couple the first calibration coil to the AC excitation signal and the first input of the differential amplifier;

wherein the apparatus is configured to be calibrated based on a measurement taken using the first calibration coil.

4. The apparatus of claim 1, further comprising:

a plurality of calibration coils, each one of the plurality of calibration coils located adjacent to a calibration piece of material similar in construction to the object being scanned, wherein the multiplexer is configured to successively couple each one of the plurality of calibration coils to the AC excitation signal and the first input of the differential amplifier, wherein the apparatus is configured to be calibrated based on measurements taken using the plurality of calibration coils.

5. An apparatus comprising:

a sensor unit having a plurality of electromagnetic coils;

an excitation/sensing circuit that generates an AC excitation signal, wherein the excitation/sensing circuit includes a differential amplifier;

a multiplexer that, at a first period of time, selectively electrically connects a first coil selected from the plurality of coils through a first predetermined impedance to the AC excitation signal; and

a source of a first reference signal,

wherein at the first period of time the first coil is selectively connected to a first input of the differential amplifier and the first reference signal is connected to a second input of the differential amplifier,

wherein at some second period of time, a second coil selected from the plurality of coils is selectively connected by the multiplexer to the AC excitation signal through the first predetermined impedance, and is selectively connected to the first input of the differential amplifier and the first reference signal is connected to the second input of the differential amplifier, and

wherein the excitation/sensing circuit is configured to demodulate a first signal from the first coil in order to detect phase and/or amplitude changes due to a magnetic anomaly of an object being scanned.

6. The apparatus of claim 5, where the source of the first reference signal includes a reference coil.

7. The apparatus of claim 5, wherein the sensor unit having the plurality of electromagnetic coils is formed as a thin-film two-dimensional array of coils on a flexible substrate that is configured to be placed in a substantially fixed position relative to a metallic object during inspection of a two-dimensional area of the object such that each respective coil of the plurality of coils measures an electromagnetic condition of a portion of the two-dimensional area of the metallic object adjacent that respective coil.

8. The apparatus of claim 5, wherein the sensor unit having the plurality of electromagnetic coils is formed as a thin-film array of coils on a flexible substrate that is configured to be placed in a substantially fixed position relative to a metallic object during inspection of an area of the object such that each respective coil of the plurality of coils measures an electromagnetic condition of a portion of the area of the metallic object adjacent that respective coil, and wherein the array of coils is arranged across a first dimension and a second dimension of the flexible substrate.

9. The apparatus of claim 5, wherein an output signal of the differential amplifier is E*cosine(ω

t+α

), wherein E is a magnitude and α

is a phase-shift due at least in part to the magnetic anomaly of an object being scanned,

the apparatus further comprising;

a first demodulator that includes a first mixer and low-pass filter coupled to receive a first signal cosine(ω

t) representing a first-phase version of the AC excitation signal and to receive the output signal E*cosine(ω

+α

) from the differential amplifier, and to output a K*cosine(α

) signal representing a real component of a demodulated signal; and

a second demodulator that includes a second mixer and low-pass filter coupled to receive a second signal sine(ω

t) representing a second-phase version of the AC excitation signal and to receive the output signal E*cosine(ω

+α

) from the differential amplifier, and to output a signal K*sine(α

) signal representing an imaginary component of the demodulated signal.

10. The apparatus of claim 9, further comprising:

a rotator that is operatively coupled to receive the outputted real component of the demodulated signal and the outputted imaginary component of the demodulated signal, and to generate output signals representative of real and imaginary portions of a sensed signal at the first period of time based on the signal from and first reference signal wherein the sensed signal has been rotated relative to the demodulated signal by a rotation angle β

, and to generate output signals representative of real and imaginary portions of a sensed signal at the second period of time based on the signal from the second coil and first reference signal wherein the sensed signal at the second period of time has been rotated relative to the demodulated signal by a rotation angle β

.

11. The apparatus of claim 10, further comprising:

a graphical output driver configured to generate an output display signal for a monitor to display a graphical representation showing magnetic anomalies as a function of position, wherein the graphical representation is based on geometrical locations of the plurality of coils in the coil array.

12. The apparatus of claim 11, wherein the plurality of coils is arranged in a two-dimensional array, and wherein the output display signal causes a display of magnetic anomalies relative to an area corresponding to the array.

13. The apparatus of claim 11, wherein the plurality of coils is arranged in a two-dimensional rectangular array, and wherein the output display signal causes a display of magnetic anomalies relative to an area corresponding to the rectangular array.

14. The apparatus of claim 10, further comprising:

a first calibration coil located adjacent to a calibration piece of material similar in construction to the object being scanned, wherein the multiplexer is configured to couple the first calibration coil to the AC excitation signal and the first input of the differential amplifier; and

a storage unit operatively coupled to store a calibration value based on a measurement using the first calibration coil.

15. The apparatus of claim 10, further comprising:

a plurality of calibration coils, each one of the plurality of calibration coils located adjacent to a calibration piece of material similar in construction to the object being scanned, wherein the multiplexer is configured to successively couple each one of the plurality of calibration coils to the AC excitation signal and the first input of the differential amplifier; and

a storage unit operatively coupled to store a plurality of calibration values each based on a measurement using one of the calibration coils.

16. A method comprising:

providing a plurality of thin-film sensing coils in an array on a substrate;

providing a plurality of thin-film reference coils;

selecting a first sensing coil from the plurality of thin-film sensing coils and establishing an analog electrical connection to the selected first sensing coil;

driving the first sensing coil with an AC excitation signal through a first predetermined impedance to obtain a first sensed signal;

selecting a first one of the plurality of reference coils and at a first period of time, establishing an analog electrical connection to the selected first reference coil and driving the first reference coil with an AC excitation signal through a second predetermined impedance to obtain a first reference signal;

demodulating the first sensed signal, wherein the demodulating of the first sensed signal includes differentially amplifying a difference between the first sensed signal and the first reference signal at the first period of time in order to detect a phase change, an amplitude change, or both phase and amplitude changes due to a magnetic anomaly of an object being scanned; and

selecting, and at a second period of time, driving a second reference coil with an AC excitation signal through the second predetermined impedance to obtain a second reference signal; and

wherein the demodulating of the first sensed signal includes differentially amplifying the second reference signal relative to the first sensed signal to obtain a differential signal at the second period of time.

17. A method comprising:

providing a plurality of thin-film coils in an array on a substrate formed as a thin-film two-dimensional array of coils on a flexible substrate;

placing the thin-film array in a substantially fixed position on a metallic object during inspection of a two-dimensional area of the object such that each respective coil of the plurality of coils measures an electromagnetic condition of a portion of the two-dimensional area of the metallic object adjacent that respective coil;

selecting a first coil from the plurality of thin-film coils and establishing an analog electrical connection to the selected first coil;

driving the first coil with an AC excitation signal through a first predetermined impedance to obtain a first sensed signal;

obtaining a first reference signal;

demodulating the first sensed signal in order to detect phase and/or amplitude changes due to a magnetic anomaly of an object being scanned, wherein

the demodulating of the first sensed signal includes differentially amplifying the first reference signal relative to the first sensed signal to obtain a differential signal at some first period of time;

at some second period of time, selecting a second coil from the plurality of coils;

driving the second coil with the AC excitation signal through the first predetermined impedance to obtain a second sensed signal; and

differentially amplifying the first reference signal relative to the second sensed signal to obtain a differential signal at some second period of time.

18. The method of claim 17, the demodulating further comprising:

mixing and low-pass filtering a cosine(ω

t)-phase version of the AC excitation signal with an output signal from the differential amplifier, and outputting a real component of a demodulated signal; and

mixing and low-pass filtering a sine (ω

t)-phase version of the AC excitation signal with the output signal from the differential amplifier, and outputting an imaginary component of the demodulated signal, wherein the real and imaginary demodulated components of the demodulated signal are two components of a demodulated signal.

19. The method of claim 18, further comprising:

rotating the demodulated signal by a preset rotation angle beta to generate output signals representative of real and imaginary portions of a sensed signal from the difference of the signal from the first coil and first reference signal at the first period of time, wherein the sensed signal has been rotated relative to the demodulated signal by the rotation angle beta during the first period of time, and to generate output signals representative of real and imaginary portions of a sensed signal from the difference of the signal from the second coil and first reference signal at the second period of time, wherein the sensed signal has been rotated relative to the demodulated signal during the second period of time by the rotation angle beta.

20. The method of claim 19, further comprising:

generating an output display signal for a monitor to display a graphical representation showing magnetic anomalies as a function of position, wherein the graphical representation is based on geometrical locations of the plurality of coils in the coil array.

21. The method of claim 20, wherein the plurality of coils is arranged in a two-dimensional array, and wherein the output display signal causes a display of magnetic anomalies relative to an area corresponding to the array.

22. The method of claim 20, wherein the plurality of coils is arranged in a two-dimensional rectangular array, and wherein the output display signal causes a display of magnetic anomalies relative to an area corresponding to the rectangular array.

23. The method of claim 19, further comprising:

providing a first calibration coil located adjacent to a calibration piece of material similar in construction to the object being scanned;

coupling the first calibration coil to the AC excitation signal and the first input of the differential amplifier; and

storing a calibration value based on a measurement using the first calibration coil.

24. The method of claim 19, further comprising:

providing a plurality of calibration coils, each one of the plurality of calibration coils located adjacent to a calibration piece of material similar in construction to the object being scanned;

successively coupling each one of the plurality of calibration coils to the AC excitation signal and the first input of the differential amplifier; and

storing a plurality of calibration values each based on a measurement using one of the calibration coils.

25. The method of claim 17, where the obtaining of the first reference signal further includes:

providing a first reference coil; and

driving the first reference coil with an AC excitation signal through a second predetermined impedance to obtain the first reference signal.

26. The method of claim 17, further comprising:

providing a plurality of thin-film reference coils;

selecting a first one of the plurality of reference coils at a first period of time, establishing an analog electrical connection to the selected first reference coil and driving the first reference coil with an AC excitation signal through a predetermined impedance to obtain the first reference signal; and

demodulating the first sensed signal, wherein the demodulating of the first sensed signal includes differentially amplifying a difference between the first sensed signal and the first reference signal at the first period of time in order to detect a phase change, an amplitude change, or both phase and amplitude changes due to a magnetic anomaly of an object being scanned.

27. An apparatus comprising:

a plurality of thin-film coils in an array on a substrate;

a plurality of thin-film reference coils;

means for selecting a first sensing coil from the plurality of thin-film sensing coils and establishing an analog electrical connection to the selected first sensing coil;

means for driving the first sensing coil with an AC excitation signal through a first predetermined impedance to obtain a first sensed signal;

means for selecting a first one of the plurality of thin-film reference coils and for, at a first period of time, establishing an analog electrical connection to the selected first reference coil and for driving the first reference coil with an AC excitation signal through a second predetermined impedance to obtain a first reference signal;

means for demodulating the first sensed signal, wherein the means for demodulating the first sensed signal includes means for differentially amplifying a difference between the first sensed signal and the first reference signal at the first period of time in order to detect phase and/or amplitude changes due to a magnetic anomaly of an object being scanned; and

means for selecting and for, at a second period of time, driving a second reference coil with an AC excitation signal through the second predetermined impedance to obtain a second reference signal; and

wherein the means for demodulating of the first sensed signal includes means for differentially amplifying the second reference signal relative to the first sensed signal to obtain a differential signal at the second period of time.

28. An apparatus comprising:

a plurality of thin-film coils in a two-dimensional array on a substrate

means for placing the thin-film array in a substantially fixed position on a metallic object during inspection of a two-dimensional area of the object such that each respective coil of the plurality of coils measures an electromagnetic condition of a portion of the two-dimensional area of the metallic object adjacent that respective coil;

means for selecting a first coil from the plurality of thin-film coils and establishing an analog electrical connection to the selected first coil;

means for driving the first coil with an AC excitation signal through a first predetermined impedance to obtain a first sensed signal;

means for obtaining a first reference signal;

means for demodulating the first sensed signal in order to detect phase and/or amplitude changes due to a magnetic anomaly of an object being scanned, wherein

the demodulating of the first sensed signal includes differentially amplifying the first reference signal relative to the first sensed signal to obtain a differential signal at some first period of time;

means for selecting, at some second period of time, a second coil from the plurality of coils;

means for driving the second coil with the AC excitation signal through a second predetermined impedance to obtain a second sensed signal; and

means for differentially amplifying the first reference signal relative to the second sensed signal to obtain a differential signal at some second period of time.

29. The apparatus of claim 28, further comprising:

means for mixing and low-pass filtering a cosine(ω

t)-phase version of the AC excitation signal with an output signal from the differential amplifier, and outputting a real component of demodulated signal; and

means for mixing and low-pass filtering a sine (ω

t)-phase version of the AC excitation signal with the output signal from the differential amplifier, and outputting an imaginary component of the demodulated signal, wherein the real and imaginary components of the demodulated signal are the two components of a demodulated signal.

30. The apparatus of claim 29, further comprising:

means for rotating the demodulated signal by a preset rotation angle beta to generate output signals representative of real and imaginary portions of a sensed signal from the difference of the signal from the first coil and first reference signal at the first period of time, wherein the sensed signal has the beta rotation angle relative to the demodulated signal during the first period of time, and to generate output signals representative of real and imaginary portions of a sensed signal from the difference of the signal from the second coil and first reference signal at the second period of time, wherein the sensed signal has been rotated relative to the demodulated signal during the second period of time by the rotation angle beta.

31. The apparatus of claim 30, further comprising:

means for generating an output display signal for a monitor to display a graphical representation showing magnetic anomalies as a function of position.

32. The apparatus of claim 31, wherein the plurality of coils is arranged in a two-dimensional array, and wherein the output display signal causes a display of magnetic anomalies relative to an area corresponding to the array.

33. The apparatus of claim 31, wherein the plurality of coils is arranged in a two-dimensional rectangular array, and wherein the output display signal causes a display of magnetic anomalies relative to an area corresponding to the rectangular array.

34. The apparatus of claim 30, further comprising:

means for providing a first calibration coil located adjacent to a calibration piece of material similar in construction to the object being scanned;

means for coupling the first calibration coil to the AC excitation signal and the first input of the differential amplifier; and

means for storing a calibration value based on a measurement using the first calibration coil.

35. The apparatus of claim 30, further comprising:

means for providing a plurality of calibration coils, each one of the plurality of calibration coils located adjacent to a calibration piece of material similar in construction to the object being scanned;

means for successively coupling each one of the plurality of calibration coils to the AC excitation signal and the first input of the differential amplifier; and

means for storing a plurality of calibration values each based on a measurement using one of the calibration coils.

36. The apparatus of claim 28, where the means for obtaining of the first reference signal further includes:

a first reference coil; and

means for driving the first reference coil with an AC excitation signal through a second predetermined impedance to obtain the first reference signal.

37. The apparatus of claim 28, further comprising:

a plurality of thin-film reference coils; and

means for selecting a first one of the plurality of thin-film reference coils and for, at a first period of time, establishing an analog electrical connection to the selected first reference coil and for driving the first reference coil with an AC excitation signal through a predetermined impedance to obtain the first reference signal;

wherein the means for demodulating the first sensed signal includes means for differentially amplifying a difference between the first sensed signal and the first reference signal at the first period of time in order to detect phase and/or amplitude changes due to a magnetic anomaly of an object being scanned.