Method and an apparatus for a waveform quality measurement

US 7,564,794 B2
Filed: 12/05/2003
Issued: 07/21/2009
Est. Priority Date: 12/14/2000
Status: Expired due to Fees

First Claim

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1. A waveform quality measurement apparatus, comprising:

an optimization circuit configured to provide a plurality of offsets of parameters of an actual signal with respect to an ideal signal;

a compensation circuit configured to compensate the actual signal with the plurality of offsets to generate a compensated actual signal;

a filtering circuit configured to filter the compensated actual signal to generate a filtered signal; and

a processor configured to modify the ideal signal to correspond to the filtered signal to generate a modified signal, and configured to determine the waveform quality measurement in accordance with the modified ideal signal and the filtered signal.

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Abstract

A method and an apparatus for waveform quality measurement are disclosed. An actual signal, representing a waveform channelized both in time and in code is generated by, e.g., an exemplary HDR communication system. Test equipment generates an ideal waveform corresponding to the actual waveform. The test equipment then generates an estimate of offsets between parameters of the actual waveform and the ideal waveform, and the offsets are used to compensate the actual waveform. The test equipment then evaluates various waveform quality measurements utilizing the compensated actual waveform and the corresponding ideal waveform. Definitions of the various waveform quality measurements as well as conceptual and practical examples of processing of the actual waveform and the corresponding ideal waveform by the test equipment are disclosed. The disclosed method and apparatus may be extended to any waveform channelized both in time and in code regardless of the equipment that generated the waveform.

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46 Claims

1. A waveform quality measurement apparatus, comprising:
- an optimization circuit configured to provide a plurality of offsets of parameters of an actual signal with respect to an ideal signal;
  
  a compensation circuit configured to compensate the actual signal with the plurality of offsets to generate a compensated actual signal;
  
  a filtering circuit configured to filter the compensated actual signal to generate a filtered signal; and
  
  a processor configured to modify the ideal signal to correspond to the filtered signal to generate a modified signal, and configured to determine the waveform quality measurement in accordance with the modified ideal signal and the filtered signal.
- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
- - 2. The apparatus of claim 1, wherein the optimization circuit is configured to provide a frequency offset, a time offset, and a phase offset.
  - 3. The apparatus of claim 1, wherein the compensation circuit is configured to compensate the actual signal with the plurality of offsets in accordance with the following equation:
    - y(t)=x(t−
      
      {circumflex over (τ
      
      )}₀)e^{j[Δ
      
      {circumflex over (ω
      
      )}·
      
      t+{circumflex over (θ
      
      )}}⁰^]where;
      
      y(t) is the compensated actual signal;
      
      x(t) is the actual signal;
      
      t is time;
      
      j is an imaginary unit;
      
      Δ
      
      {circumflex over (ω
      
      )} is the frequency offset;
      
      {circumflex over (τ
      
      )}₀is the time offset; and
      
      {circumflex over (θ
      
      )}₀is the phase offset.
  - 4. The apparatus of claim 1, wherein the filtering circuit is configured to filter the compensated signal by assigning the compensated actual signal a value that is zero in intervals to be filtered and non-zero elsewhere.
  - 5. The apparatus of claim 4, wherein the filtering circuit is configured to filter the compensated signal by assigning the compensated actual signal a value that is non-zero over an elementary unit of the actual signal.
  - 6. The apparatus of claim 4, wherein the filtering circuit assigns the compensated actual signal value by defining a function with a value that is zero in intervals to be filtered and non-zero elsewhere, and by multiplying the compensated actual signal by the function.
  - 7. The apparatus of claim 6, wherein the filtering circuit defines a function with a value that is non-zero over an elementary unit of the actual signal.
  - 8. The apparatus of claim 1, wherein the processor generates the modified ideal signal to have a value that is zero in intervals where the filtered signal has a value of zero and non-zero elsewhere.
  - 9. The apparatus of claim 1, wherein the processor is configured to modify the ideal signal by assigning the ideal signal a value that is zero in intervals where the filtered signal has a value of zero and non-zero elsewhere.
  - 10. The apparatus of claim 1, wherein the processor assigns the ideal signal a value by defining a function with a value that is zero in intervals where the filtered signal has a value of zero and non-zero elsewhere, and by multiplying the compensated actual signal by the function.
  - 11. The apparatus of claim 5, wherein the processor is configured to determine the waveform quality by calculating a first overall modulation accuracy.
  - 12. The apparatus of claim 11, wherein the processor calculates a first modulation accuracy by calculating in accordance with the following equation:
    - $ρ_{overall - 1} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = 1}^{M} Z_{j, k} R_{j, k}^{*} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle R_{j, k} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle Z_{j, k} \rangle}^{2}}}$ where;
      
      ρ
      
      _overall-1is the first overall modulation accuracy;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      Z_j,k=z[M(j−
      
      1)+k] is a k_thsample in the j_thelementary unit of the filtered signal; and
      
      R_j,k=r[M(j−
      
      1)+k] is a k_thsample in the j_thelementary unit of the ideal signal.
  - 13. The apparatus of claim 11, wherein the processor is further configured to determine the waveform quality by calculating a second overall modulation accuracy.
  - 14. The apparatus of claim 13, wherein the processor calculates a second modulation accuracy in accordance with the following equation:
    - $ρ_{overall - 2} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = \frac{M}{2} + 1}^{M + \frac{M}{2} + 1} Z_{j, k} R_{j, k}^{*} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = \frac{M}{2} + 1}^{M + \frac{M}{2} + 1} {\langle R_{j, k} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = \frac{M}{2} + 1}^{M + \frac{M}{2} + 1} {\langle Z_{j, k} \rangle}^{2}}}$ where;
      
      ρ
      
      _overall-2is the second modulation accuracy;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      $Z_{j, k} = z [(M + \frac{M}{2} + 1) \cdot (j - 1) + k]$
      
      is a k_thsample in the j_thelementary unit of the filtered signal; and
      
      $R_{j, k} = r [(M + \frac{M}{2} + 1) \cdot (j - 1) + k]$
      
      is a k_thsample in the j_thelementary unit of the ideal signal.
  - 15. The apparatus of claim 4, wherein the processor is configured to determine the waveform quality by calculating a modulation accuracy for a time division channel.
  - 16. The apparatus of claim 15, wherein the processor calculates a modulation accuracy for a time division channel in accordance with the following equation:
    - $ρ_{TDM_channel} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = 1}^{M} Z_{j, k} R_{j, k}^{*} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle R_{j, k} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle Z_{j, k} \rangle}^{2}}}$ where;
      
      ρ
      
      _TDM_—_channelis the modulation accuracy for the time division channel TDM_channel;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      Z_j,k=z[M(j−
      
      1)+k] is a kth sample in the jth elementary unit of the filtered signal; and
      
      R_j,k=r[M(j−
      
      1)+k] is a kth sample in the jth elementary unit of the ideal signal.
  - 17. The apparatus of claim 4, wherein the processor is configured to determine the waveform quality measurement by calculating code domain power coefficients.
  - 18. The apparatus of claim 17, wherein the processor calculates code domain power coefficients in accordance with the following equation:
    - $ρ_{TDM_channel, i} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = 1}^{M} Z_{j, k} R_{i, j, k}^{' *} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle R_{i, j, k}^{'} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle Z_{j, k} \rangle}^{2}}}, i = w_{1}, \dots, w_{v}$ where;
      
      ρ
      
      _TDM_—_channel,iis the code domain coefficient for a time division channel TDM_channel and a code channel i;
      
      wl is a first code channel for the time division channel TDM_channel;
      
      wv is a last code channel for time division channel TDM_channel;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      Z_J,k=z[M(j−
      
      1)+k] is a kth sample in the jth elementary unit of the filtered signal; and
      
      R′
      
      _i,j,k=R′
      
      _i[M(j−
      
      1)+k] is a kth sample in the jth elementary unit of the i-th code channel of the ideal signal.

19. A computer-readable medium including program code stored thereon, for determining a waveform quality measurement, comprising:
- program code to provide a plurality of offsets of parameters of an actual signal with respect to an ideal signal;
  
  program code to compensate the actual signal with the plurality of offsets to generate a compensated actual signal;
  
  program code to filter the compensated actual signal to generate a filtered signal;
  
  program code to modify the ideal signal to correspond to the filtered signal to generate a modified signal; and
  
  program code to determine the waveform quality measurement in accordance with the modified ideal signal and the filtered signal.
- View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36)
- - 20. The computer-readable medium of claim 19, wherein the program code to provide a plurality of offsets comprises program code to provide a frequency offset, a time offset, and a phase offset.
  - 21. The computer-readable medium of claim 19, wherein the program code to compensate the actual signal with the plurality of offsets comprises program code to compensate in accordance with the following equation:
    - y(t)=x(t−
      
      {circumflex over (τ
      
      )}₀)e^{j[Δ
      
      {circumflex over (ω
      
      )}·
      
      t+{circumflex over (θ
      
      )}}⁰^]where;
      
      y(t) is the compensated actual signal;
      
      x(t) is the actual signal;
      
      t is time;
      
      j is an imaginary unit;
      
      Δ
      
      {circumflex over (ω
      
      )} is the frequency offset;
      
      {circumflex over (τ
      
      )}₀is the time offset; and
      
      {circumflex over (ω
      
      )}₀is the phase offset.
  - 22. The computer-readable medium of claim 19, wherein the program code to filter comprises program code to assign the compensated actual signal a value that is zero in intervals to be filtered and non-zero elsewhere.
  - 23. The computer-readable medium of claim 22, wherein the program code to filter comprises program code to assign the compensated actual signal a value that is non-zero over an elementary unit of the actual signal.
  - 24. The computer-readable medium of claim 22, wherein the program code to assign the compensated actual signal value comprises:
    - program code to define a function with a value that is zero in intervals to be filtered and non-zero elsewhere; and
      
      program code to multiply the compensated actual signal by the function.
  - 25. The computer-readable medium of claim 24, wherein the program code to define a function comprises program code to define a function with a value that is non-zero over a elementary unit of the actual signal.
  - 26. The computer-readable medium of claim 19, wherein the program code to modify the ideal signal comprises program code to generate the modified ideal signal to have a value that is zero in intervals where the filtered signal has a value of zero and non-zero elsewhere.
  - 27. The computer-readable medium of claim 19, wherein the program code to modify the ideal signal comprises program code to assign the ideal signal a value that is zero in intervals where the filtered signal has a value of zero and non-zero elsewhere.
  - 28. The computer-readable medium of claim 27, wherein the program code to assign the ideal signal a value comprises:
    - program code to define a function with a value that is zero in intervals where the filtered signal has a value of zero and non-zero elsewhere; and
      
      program code to multiply the compensated actual signal by the function.
  - 29. The computer-readable medium of claim 23, wherein the program code to determine the waveform quality comprises program code to calculate a first overall modulation accuracy.
  - 30. The computer-readable medium of claim 29, wherein the program code to calculate a first modulation accuracy comprises program code to calculate in accordance with the following equation:
    - $ρ_{overall - 1} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = 1}^{M} Z_{j, k} R_{j, k}^{*} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle R_{j, k} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle Z_{j, k} \rangle}^{2}}}$ where;
      
      ρ
      
      _overall-1is the first overall modulation accuracy;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      Z_j,k=z[M(j−
      
      1)+k] is a k_thsample in the j_thelementary unit of the filtered signal; and
      
      R_j,k=r[M(j−
      
      1)+k] is a k_thsample in the j_thelementary unit of the ideal signal.
  - 31. The computer-readable medium of claim 29, further comprising program code to calculate a second overall modulation accuracy.
  - 32. The computer-readable medium of claim 31, wherein the program code to calculate a second modulation accuracy comprises program code to calculate in accordance with the following equation:
    - $ρ_{overall - 2} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = \frac{M}{2} + 1}^{M + \frac{M}{2} + 1} Z_{j, k} R_{j, k}^{*} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = \frac{M}{2} + 1}^{M + \frac{M}{2} + 1} {\langle R_{j, k} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = \frac{M}{2} + 1}^{M + \frac{M}{2} + 1} {\langle Z_{j, k} \rangle}^{2}}}$ where;
      
      ρ
      
      _overall-2is the second modulation accuracy;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      $Z_{j, k} = z [(M + \frac{M}{2} + 1) \cdot (j - 1) + k]$
      
      is a k_thsample in the j_thelementary unit of the filtered signal; and
      
      $R_{j, k} = r [(M + \frac{M}{2} + 1) \cdot (j - 1) + k]$
      
      is a k_thsample in the j_thelementary unit of the ideal signal.
  - 33. The computer-readable medium of claim 22, wherein the program code to determine the waveform quality comprises program code to calculate a modulation accuracy for a time division channel.
  - 34. The computer-readable medium of claim 33, wherein the program code to calculate a modulation accuracy for a time division channel comprises program code to calculate in accordance with the following equation:
    - $ρ_{TDM_channel} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = 1}^{M} Z_{j, k} R_{j, k}^{*} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle R_{j, k} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle Z_{j, k} \rangle}^{2}}}$ where;
      
      ρ
      
      _TDM_—_channelis the modulation accuracy for the time division channel TDM_channel;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      Z_J,k=z[M(j−
      
      1)+k] is a k_thsample in the j_thelementary unit of the filtered signal; and
      
      R_j,k=r[M(j−
      
      1)+k] is a k_thsample in the j_thelementary unit of the ideal signal.
  - 35. The computer-readable medium of claim 22, wherein the program code to determine the waveform quality measurement comprises program code to calculate code domain power coefficients.
  - 36. The computer-readable medium of claim 35, wherein the program code to calculate code domain power coefficients comprises program code to calculate in accordance with the following equation:
    - $ρ_{TDM_channel, i} = \frac{N \cdot \sum_{j = 1}^{N} {\langle \sum_{k = 1}^{M} Z_{j, k} R_{i, j, k}^{' *} \rangle}^{2}}{{\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle R_{i, j, k}^{'} \rangle}^{2}} \cdot {\sum_{j = 1}^{N} \sum_{k = 1}^{M} {\langle Z_{j, k} \rangle}^{2}}}, i = w_{1}, \dots, w_{v}$ where;
      
      ρ
      
      _TDM_—_channel,iis the code domain coefficient for a time division channel TDM_channel and a code channel i;
      
      wl is a first code channel for the time division channel TDM_channel;
      
      wv is a last code channel for time division channel TDM_channel;
      
      j is an index designating an elementary unit of signals;
      
      N is a summation limit designating a number of elementary units;
      
      k is an index designating a sample in the elementary unit;
      
      M is a summation limit designating a number of samples in the elementary unit;
      
      Z_j,k=z[M(j−
      
      1)+k] is a kth sample in the jth elementary unit of the filtered signal; and
      
      R′
      
      _i,j,k=R′
      
      _i[M(j−
      
      1)+k] is a kth sample in the jth elementary unit of the i-th code channel of the ideal signal.

37. A method for measuring waveform quality, the method comprising:
- providing a plurality of offsets of parameters of an actual signal with respect to an ideal signal;
  
  compensating the actual signal with the plurality of offsets to generate a compensated actual signal;
  
  filtering the compensated actual signal to generate a filtered signal; and
  
  modifying the ideal signal to correspond to the filtered signal to generate a modified signal, and determining the waveform quality measurement in accordance with the modified ideal signal and the filtered signal.
- View Dependent Claims (38, 39, 40, 41)
- - 38. The method of claim 37, further comprising providing a frequency offset, a time offset, and a phase offset.
  - 39. The method of claim 37, further comprising filtering the compensated signal by assigning the compensated actual signal a value that is zero in intervals to be filtered and non-zero elsewhere.
  - 40. The method of claim 39, further comprising filtering the compensated signal by assigning the compensated actual signal a value that is non-zero over an elementary unit of the actual signal.
  - 41. The method of claim 39, further comprising assigning the compensated actual signal value by defining a function with a value that is zero in intervals to be filtered and non-zero elsewhere, and multiplying the compensated actual signal by the function.

42. An apparatus for measuring waveform quality, the apparatus comprising:
- means for providing a plurality of offsets of parameters of an actual signal with respect to an ideal signal;
  
  means for compensating the actual signal with the plurality of offsets to generate a compensated actual signal;
  
  means for filtering the compensated actual signal to generate a filtered signal; and
  
  means for modifying the ideal signal to correspond to the filtered signal to generate a modified signal, and determining the waveform quality measurement in accordance with the modified ideal signal and the filtered signal.
- View Dependent Claims (43, 44, 45, 46)
- - 43. The apparatus of claim 42, further comprising means for providing a frequency offset, a time offset, and a phase offset.
  - 44. The apparatus of claim 42, further comprising means for filtering the compensated signal by assigning the compensated actual signal a value that is zero in intervals to be filtered and non-zero elsewhere.
  - 45. The apparatus of claim 42, further comprising means for filtering the compensated signal by assigning the compensated actual signal a value that is non-zero over an elementary unit of the actual signal.
  - 46. The apparatus of claim 42, further comprising means for assigning the compensated actual signal value by defining a function with a value that is zero in intervals to be filtered and non-zero elsewhere, and multiplying the compensated actual signal by the function.

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Current Assignee
Qualcomm, Inc.
Original Assignee
Qualcomm, Inc.
Inventors
Black, Peter, Montojo, Juan, Sindhushayana, Nagabhushana
Primary Examiner(s)
Chan; Wing F
Assistant Examiner(s)
Jones; Prenell P

Application Number

US10/728,648
Publication Number

US 20040114505A1
Time in Patent Office

2,055 Days
Field of Search

370/241, 370/389, 370/252, 370/203, 370/508, 370/503, 370/210, 370/246, 370/334, 370/344, 370/303, 370/335, 370/342, 370/519, 370/209, 370/208, 375/295, 375/260, 375/296, 375/228, 375/222, 375/300, 375/320, 375/346, 375/130, 375/224, 375/226, 375/324, 375/265, 375/240, 375/319, 375/345, 358/461, 358/406, 358/443, 358/446, 358/474, 455/15, 455/25, 455/101, 455/272, 455/303, 455/339, 455/452, 455/450, 455/67, 379/1.04, 379/100, 702/69, 702/72, 702/80
US Class Current

370/241
CPC Class Codes

H04B 1/707 using direct sequence modul...

H04B 17/309 Measuring or estimating cha...

Method and an apparatus for a waveform quality measurement

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Method and an apparatus for a waveform quality measurement

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