Method of actuating a test function of an electrical switching apparatus and electrical switching apparatus employing the same

• US 7,570,062 B2
• Filed: 12/10/2004
• Issued: 08/04/2009
• Est. Priority Date: 12/10/2004
• Status: Active Grant

• Current Assignee: Eaton Intelligent Power Limited (Eaton Corporation PLC.)
• Original Assignee: Eaton Corp. (Wisconsin) (Eaton Corporation PLC.)
• Inventors: Mills, Patrick W., Benshoff, Richard G., Gonyea, Kevin D.
• Primary Examiner(s): Dole; Timothy J
• Assistant Examiner(s): NGUYEN, HOAI AN D
• Application Number:
  US11/008,067
• Publication Number:
  US 20060125582A1
• Time in Patent Office: 1,698 Days
• Field of Search: 324415-424, 324/66, 324/67, 361/1, 361/42, 361/179
• US Class Current: 324/415
• CPC Class Codes: H01H 2083/201 the other abnormal electrical condition being an arc fault
• CPC Class Codes: H01H 71/128 Manual release or trip mechanisms, e.g. for test purposes two similar push buttons for closing or resetting and opening or tripping H01H71/58; test switches for earth fault circuit breakers H01H83/04
• CPC Class Codes: H01H 83/04 with testing means for indicating the ability of the switch or relay to function properly

Abstract

An arc fault circuit breaker includes a housing, separable contacts, an operating mechanism adapted to open and close the separable contacts, and an arc fault trip mechanism cooperating with the operating mechanism to trip open the separable contacts. The arc fault trip mechanism includes an arc fault test circuit adapted to simulate an arc fault trip condition to trip open the separable contacts. A proximity sensor, such as a Hall effect sensor, is adapted to sense a magnetic target to actuate the arc fault test circuit.

Claims

1. A method of actuating a trip test function of a circuit interrupter, said method comprising:

employing a proximity sensor in said circuit interrupter;

sensing a target with said proximity sensor; and

responsive to said sensing a target with said proximity sensor, actuating said trip test function of said circuit interrupter.

2. The method of claim 1 further comprising

employing said circuit interrupter including a housing having an opening;

and

disposing said proximity sensor completely within said housing and proximate the opening thereof.

3. The method of claim 2 further comprising

employing as said target a magnetic target;

employing said magnetic target having a keyed shape; and

keying said opening to accept the keyed shape of said magnetic target.

4. The method of claim 1 further comprising

employing said circuit interrupter including an arc fault trip mechanism;

and

outputting a pulse train signal to simulate an arc fault trip condition responsive to said sensing a target with said proximity sensor.

5. The method of claim 1 further comprising

employing as said proximity sensor a Hall effect sensor.

6. The method of claim 1 further comprising

employing as said target a magnetic target.

7. The method of claim 6 further comprising

employing a wand including said magnetic target.

8. A method of actuating a test function of a circuit interrupter, said method comprising:

employing a proximity sensor in said circuit interrupter;

sensing a target with said proximity sensor;

responsive to said sensing a target, actuating said test function of said circuit interrupter;

employing a circuit breaker including separable contacts as said circuit interrupter;

employing with said circuit breaker a trip mechanism including a test circuit adapted to simulate a trip condition to trip open said separable contacts; and

outputting a signal to simulate a trip condition to trip open said separable contacts responsive to said sensing a target with said proximity sensor.

9. The method of claim 8 further comprising

employing as said trip mechanism an arc fault trip mechanism.

10. The method of claim 9 further comprising

outputting a pulse train signal to simulate an arc fault trip condition responsive to said sensing a target with said proximity sensor.

11. An electrical switching apparatus comprising:

a housing;

separable contacts;

an operating mechanism adapted to open and close said separable contacts; and

a trip mechanism cooperating with said operating mechanism to trip open said separable contacts, said trip mechanism comprising;

a trip test circuit structured to simulate a trip condition to trip open said separable contacts, and

a proximity sensor structured to sense a target to actuate said trip test circuit.

12. The electrical switching apparatus of claim 11 wherein said housing includes an opening;

and wherein said proximity sensor is disposed completely within said housing and proximate the opening thereof.

13. The electrical switching apparatus of claim 12 wherein said target is a magnetic target having a keyed shape;

and wherein said opening is keyed to accept the keyed shape of said magnetic target.

14. The electrical switching apparatus of claim 11 wherein said trip mechanism is an arc fault trip mechanism;

and wherein said trip test circuit is adapted to output a pulse train signal to simulate an arc fault trip condition to trip open said separable contacts.

15. The electrical switching apparatus of claim 11 wherein said proximity sensor is a Hall effect sensor.

16. The electrical switching apparatus of claim 11 wherein said target is a magnetic target.

17. The electrical switching apparatus of claim 11 wherein said target is a wand including a magnetic target.

18. The electrical switching apparatus of claim 11 wherein said proximity sensor includes an output which is actuated when said target is sensed;

and wherein said trip test circuit includes a processor having an input receiving the output of said proximity sensor and also having an output.

19. The electrical switching apparatus of claim 18 wherein the output of said processor is actuated responsive to the input of said processor receiving the actuated output of said proximity sensor.

20. The electrical switching apparatus of claim 19 wherein said trip mechanism is an arc fault trip mechanism;

and wherein the output of said processor includes a pulse train signal to simulate an arc fault trip condition for said arc fault trip mechanism.

21. A method of actuating a test function of a circuit interrupter, said method comprising:

employing a proximity sensor in said circuit interrupter;

sensing a target with said proximity sensor;

responsive to said sensing a target, actuating said test function of said circuit interrupter;

employing said circuit interrupter including a housing having an opening;

disposing said proximity sensor completely within said housing and proximate the opening thereof; and

passing said target from outside of said housing, through the opening of said housing, and toward said proximity sensor.

22. The method of claim 21 further comprising

employing as said target a magnetic target;

employing said magnetic target having a keyed shape; and

keying said opening to accept the keyed shape of said magnetic target.