Methods and systems for binning defects detected on a specimen
First Claim
1. A computer-implemented method for binning defects detected on a specimen, comprising:
- performing on a computer processor the following steps;
comparing a test image to reference images, wherein the test image comprises an image of one or more patterned features formed on the specimen proximate to a defect detected on the specimen, and wherein the reference images comprise images of one or more patterned features associated with different regions of interest within a device being formed on the specimen;
and if the one or more patterned features of the test image match the one or more patterned features of one of the reference images, assigning the defect to a bin corresponding to the region of interest associated with the one of the reference images.
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Abstract
Methods and systems for binning defects detected on a specimen are provided. One method includes comparing a test image to reference images. The test image includes an image of one or more patterned features formed on the specimen proximate to a defect detected on the specimen. The reference images include images of one or more patterned features associated with different regions of interest within a device being formed on the specimen. If the one or more patterned features of the test image match the one or more patterned features of one of the reference images, the method includes assigning the defect to a bin corresponding to the region of interest associated with the reference image.
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Citations
45 Claims
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1. A computer-implemented method for binning defects detected on a specimen, comprising:
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performing on a computer processor the following steps; comparing a test image to reference images, wherein the test image comprises an image of one or more patterned features formed on the specimen proximate to a defect detected on the specimen, and wherein the reference images comprise images of one or more patterned features associated with different regions of interest within a device being formed on the specimen; and if the one or more patterned features of the test image match the one or more patterned features of one of the reference images, assigning the defect to a bin corresponding to the region of interest associated with the one of the reference images. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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26. A computer-implemented method for binning defects detected on a specimen, comprising:
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performing on a computer processor the following steps; comparing a first test image to a second test image, wherein the first test image comprises an image of one or more patterned features formed on the specimen proximate to a first defect detected on the specimen, and wherein the second test image comprises an image of one or more patterned features formed on the specimen proximate to a second defect detected on the specimen; and if the one or more patterned features in the first and second test images match, assigning the first and second defects to the same bin. - View Dependent Claims (27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45)
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Specification