Dynamic schema-based silicon IP analysis, qualification, data exchange, and integration

• US 7,571,184 B2
• Filed: 02/08/2006
• Issued: 08/04/2009
• Est. Priority Date: 02/08/2006
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Salehi, Azadeh, Hekmatpour, Amir
• Primary Examiner(s): Trujillo; James
• Assistant Examiner(s): Black; Linh
• Application Number:
  US11/349,846
• Publication Number:
  US 20070185898A1
• Time in Patent Office: 1,273 Days
• Field of Search: 707/100, 707/102
• US Class Current: 1/1
• CPC Class Codes: G06F 30/30 Circuit design

Abstract

Methods for dynamic schema-based silicon IP analysis, qualification, data exchange, and integration are disclosed. Embodiments include determining a new resident schema associated with a function of a silicon IP design system that is different than a previous resident schema associated with a current view. Embodiments further include analyzing components of the new resident schema and parsing the current view and repository or IP database based on the new resident schema to extract pertinent data from the current view and the database and generating a new view by mapping the extracted data to the new resident schema where the new view includes viewable data associated with the function. Further embodiments may include presenting the generated new view to a user or storing the viewable data in a database. The new resident schema may be described in an XML or other appropriate schema language and notations.

Claims

1. A method for dynamically adjusting system features based on a schema, the method comprising:

determining that a new resident schema associated with a function of a silicon IP design system is in a current view, the new resident schema being different than a previous resident schema associated with the current view and being associated with a silicon IP described in a hardware description language, wherein the new resident schema comprises an indication of inputs, outputs, functionality, and interface protocols of a silicon IP;

analyzing components of the new resident schema by parsing and classifying schema components based on contents of an IP schema knowledge base comprising specifications for one or more silicon IPs each described in a hardware description language;

parsing the current view based on the new resident schema to extract data from the current view to identify all elements and types to be changed in response to the new resident schema; and

generating a new view by mapping the extracted data to the new resident schema, the new view comprising viewable data associated with the function of the design system by initializing and configuring the new view based on the new resident schema, calling regeneration and integrity checking functions for the new view, and instantiating the new view.

2. The method of claim 1, further comprising performing the design system function.

3. The method of claim 1, further comprising after generating the new view, configuring and presenting the generated new view to a user.

4. The method of claim 1, further comprising after generating the new view, storing the viewable data in a database.

5. The method of claim 1, further comprising configuring the viewable data to a different schema.

6. The method of claim 1, wherein the function of the silicon IP design system is one or more of a submit IP function, an IP search function, an IP qualify function, an IP quality standard function, or a vendor evaluation function.

7. The method of claim 1, wherein the new resident schema is an XML schema.