System and method of controlling power consumption in an electronic system by applying a uniquely determined minimum operating voltage to an integrated circuit rather than a predetermined nominal voltage selected for a family of integrated circuits

• US 7,577,859 B2
• Filed: 02/20/2004
• Issued: 08/18/2009
• Est. Priority Date: 02/20/2004
• Status: Active Grant

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Bilak, Mark
• Primary Examiner(s): CONNOLLY, MARK A
• Application Number:
  US10/708,270
• Publication Number:
  US 20050188230A1
• Time in Patent Office: 2,006 Days
• Field of Search: 713/300, 713/320, 713/322, 713/500, 713/600, 702/57, 702/62, 702/64, 702/117, 702/118, 702/122
• US Class Current: 713/320
• CPC Class Codes: G06F 1/3203 Power management, i.e. event-based initiation of a power-saving mode
• CPC Class Codes: G06F 1/3284 Power saving in printer
• CPC Class Codes: G06F 1/3296 by lowering the supply or operating voltage
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

A method and apparatus for adaptively adjusting the operating voltage of an integrated circuit in response to tester-to-system variations, worst-case testing techniques, process variations, temperature variations, or reliability wearout mechanisms. The minimum operating voltage of an integrated circuit is determined either during external testing of the integrated circuit or during built-in-self-testing. The minimum operating voltage is transmitted to a variable voltage regulator where it is used to set the output of the regulator. The output of the regulator supplies the integrated circuit with its operating voltage. This technique enables tailoring of the operating voltage of integrated circuits on a part-by-part basis which results in power consumption optimization by adapting operating voltage in response to tester-to-system variations, worst-case testing techniques, process variations, temperature variations or reliability wearout mechanisms. Alternatively, the invention enables adaptive adjustment of the operating frequency of an integrated circuit. The invention enables system designers to adaptively optimize either system performance or power consumption on a part-by-part basis in response to tester-to system variations, worst-case testing techniques, process variations, temperature variations or reliability wearout mechanisms.

Claims

1. An apparatus for adaptively controlling power consumption within an electronic system, said apparatus comprising:

an integrated circuit adapted to transmit voltage control information corresponding to a difference between a minimum operating voltage uniquely determined for the integrated circuit plus a guard band and a predetermined nominal voltage selected for a family of integrated circuits;

a storage element coupled to said integrated circuit, adapted to store said minimum operating voltage;

a variable voltage regulator coupled to said integrated circuit, adapted to receive said voltage control information from said integrated circuit, and supply an operating voltage to said integrated circuit in response to and representative of said voltage control information; and

a communication link coupled to said integrated circuit and said variable voltage regulator, adapted to link said integrated circuit to said variable voltage regulator so that said integrated circuit may transmit said voltage control information to said variable voltage regulator.

2. The apparatus of claim 1 wherein said minimum operating voltage is determined during external testing of said integrated circuit.

3. The apparatus of claim 1 wherein said storage element is a nonvolatile memory.

4. The apparatus of claim 1 further comprising a temperature sensing means coupled to said integrated circuit and adapted to measure and transmit temperature data to said integrated circuit.

5. The apparatus of claim 4 wherein said integrated circuit is further adapted to modify said voltage control information in response to said temperature data.

6. The apparatus of claim 1 further comprising a built-in-self-test circuit coupled to said integrated circuit, adapted to test said integrated circuit and determine said minimum operating voltage.

7. The apparatus of claim 6 further comprising a temperature sensing means coupled to said integrated circuit and adapted to measure and transmit temperature data to said integrated circuit.

8. The apparatus of claim 7 wherein said integrated circuit is further adapted to modify said voltage control information in response to said temperature data.

9. A method of adaptively controlling power consumption within an electronic system, said method comprising the steps of:

testing an integrated circuit to determine a minimum operating voltage uniquely determined for said integrated circuit;

storing said minimum operating voltage;

transmitting a signal to a variable voltage regulator, wherein said signal corresponds to a difference between said minimum operating voltage uniquely determined for said integrated circuit plus a guard band and a predetermined nominal voltage selected for a family of integrated circuits;

programming an output voltage of said variable voltage regulator in response to and representative of said signal; and

supplying said output voltage to said integrated circuit.

10. The method of claim 9 wherein said minimum operating voltage is determined during external testing of said integrated circuit.

11. The method of claim 10 wherein said minimum operating voltage is determined by testing timing critical paths within said integrated circuit.

12. The method of claim 9 wherein said minimum operating voltage is determined by testing said integrated circuit with a built-in-self-test circuit.

13. The method of claim 12 wherein said testing comprises the steps of:

initializing said built-in self-test circuit;

accessing test patterns;

executing said testing; and

adjusting said minimum operating voltage of said integrated circuit in response to said testing.

14. The method of claim 13 wherein said test patterns exercise timing critical paths within said integrated circuit.

15. The method of claim 9 further comprising:

measuring temperature data; and

transmitting said temperature data to said integrated circuit.

16. The method of claim 15 further comprising modifying said signal in response to said temperature data.

17. A power control arrangement, comprising:

means for testing an integrated circuit to determine a minimum operating voltage uniquely determined for said integrated circuit;

means for storing said minimum operating voltage;

means for transmitting a signal to a variable voltage regulator, wherein said signal corresponds to a difference between said minimum operating voltage uniquely determined for said integrated circuit plus a guard band and a predetermined nominal voltage selected for a family of integrated circuits;

means for programming an output voltage of said variable voltage regulator in response to and representative of said signal; and

means for supplying said output voltage to said integrated circuit.