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High density interconnect system for IC packages and interconnect assemblies

  • US 7,579,848 B2
  • Filed: 02/07/2006
  • Issued: 08/25/2009
  • Est. Priority Date: 05/23/2000
  • Status: Expired due to Fees
First Claim
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1. An apparatus, comprising:

  • a first connector structure comprising at least one contactor substrate having a contact surface and a bonding surface, the at least one contactor substrate comprising an array of at least one electrically conductive monolithically formed micro-fabricated stress metal spring contact located on and extending from the contact surface;

    a second connector structure comprising a substrate having a first connector surface and a second surface opposite the connector surface, and comprising an array of at least one electrically conductive contact pad located on the first connector surface and corresponding to the array of at least one electrically conductive spring contact, and an array of at least one electrically conductive path extending from the first connector surface to the second surface;

    means for any of movably positioning and aligning the first connector structure and the second connector structure between at least a first position and a second position with respect to each other; and

    means for mechanically affixing the first connector structure and the second connector structure, wherein the affixing means comprises at least one latchable interface between the first connector structure and the second connector structure.

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